2002
DOI: 10.1253/circj.66.746
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High Incidence of Device-Related and Lead-Related Complications in the Dual-Chamber Implantable Cardioverter Defibrillator Compared With the Single-Chamber Version.

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Cited by 54 publications
(38 citation statements)
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“…Twenty device-related complications occurred in 19 patients. The overall complication rate was slightly higher than that reported from other dual-chamber ICD trials (13% to 16%/7.1 to 9 months 28,29 ). The number of atrial leads to be revised was close to the complication rate reported in other dual-chamber trials: 3.4% and 11% in 1.7 and 13.3 months, respectively.…”
Section: Device-related Complicationscontrasting
confidence: 63%
“…Twenty device-related complications occurred in 19 patients. The overall complication rate was slightly higher than that reported from other dual-chamber ICD trials (13% to 16%/7.1 to 9 months 28,29 ). The number of atrial leads to be revised was close to the complication rate reported in other dual-chamber trials: 3.4% and 11% in 1.7 and 13.3 months, respectively.…”
Section: Device-related Complicationscontrasting
confidence: 63%
“…[27][28][29][30] These observations may reflect differences in severity of underlying cardiac disease.…”
Section: Discussionmentioning
confidence: 99%
“…Additional causes for chronic mechanical stress on the lead could be higher activity as in younger patients, restricted anatomic circumstances as in female patients, or multiple leads in the vein. 25 Insulation damage caused by mechanical stress is time dependent. Therefore, lead failure becomes more common a problem in younger ICD patients and patients with better preserved left ventricular function who have a longer life expectancy.…”
Section: Mechanisms Of Lead Failurementioning
confidence: 99%