High-level TCAD task representation and automation

Pichler, C.; Plasun, R.; Sträßer, Rudolf; Selberherr, S.

doi:10.1109/tcad.1996.6449162

Cited by 6 publications

(2 citation statements)

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“…Compared with the traditional satellite piggyback experiments and ground simulation experiments, computer simulation has the advantages of small cost, short time, strong control and high repeatability, and can also effectively reveal the circuit failure mechanism, as well as evaluate the integrated circuits in the development stage, so more and more researchers choose computer simulation. With the advancement of computer-aided design technology, TCAD simulation tools have become an effective means of simulating devices to carry out irradiation resistance analysis [1][2] . The TCAD software enables modeling of advanced process devices and 3D transient simulation of CMOS circuits and FinFET containing dozens of transistors, and can effectively shorten the design cycle and reduce evaluation costs [3] .…”

Section: Introductionmentioning

confidence: 99%

Advanced process library irradiation parameter modeling and analysis techniques

Shi,

Wang,

Sang

et al. 2023

Second International Conference on Electronic Information Technology (EIT 2023)

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The irradiation experimental analysis of chips can obtain irradiation data of advanced processes, which is beneficial to guide the research of new generation of anti-irradiation chips. In this paper, based on the GDS layout of the advanced process library, we firstly design the GDS layout hierarchy information extraction technology and implement the standard cell TCAD model automatic generation technology, then design the algorithm to generate irradiation parameters for heavy ion bombardment simulation experiments, and finally analyze the experimental data to establish the irradiation database. The experimental results show that it is feasible to establish an automatic irradiation data acquisition scheme based on the GDS layout of the advanced process library.

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Section: Introductionmentioning

confidence: 99%

Advanced process library irradiation parameter modeling and analysis techniques

Shi,

Wang,

Sang

et al. 2023

Second International Conference on Electronic Information Technology (EIT 2023)

View full text Add to dashboard Cite

show abstract

“…Grid manipulations can also be necessary between the simulation steps. For these fairly complex tasks the Vienna Integrated System for TCAD Applications (VISTA) [1], [2] has been developed.…”

Section: Introductionmentioning

confidence: 99%