Field-effect charge carrier mobilities (μ) exceeding 1 cm 2 V −1 s −1 have been reported in several polymers and small molecules. [7][8][9][10][11][12] However, in many cases, how to calculate mobility may be unclear to the extent that recent articles have highlighted this challenge. [7,13,14] Specifically, the slope of the square root of the drain current (I d ) versus gate voltage (V g ) is commonly used to calculate the saturation regime field-effect carrier mobility and in an ideal case should be constant across all V g . For μ, the dependence of I d on channel width (W), length (L), capacitance (C i ), and threshold voltage (V T ) is given by:The slope has been observed in several examples to increase with increasing V g . [15] In other cases, the opposite occurs; a larger slope is observed at low V g and decreases at high V g (i.e., a "double-slope"). [16][17][18] Please refer to the Supporting Information for particular examples from the literature. Figure 1a illustrates this so-called "double-slope" phenomenon by plotting experimentally-obtained I d 1/2 versus V g in the case of the polymer PCDTPT [19] (Figure 1b) next to a calculation of an ideal, single-slope curve. For the double-slope, μ is higher at small |V g | and decreases at larger |V g |, whereas the ideal case shows μ being independent of V g . In some cases, it can therefore be ambiguous how to calculate μ for a particular material under these circumstances, which prevents the goal of obtaining structure-electronic property relationships of general utility.There may be many different causes of the double-slope. Charge conduction in the bulk, rather than near the dielectric interface, contact resistance effects, and charge interaction with the dielectric layer have all been implicated as possible reasons. [7,20] In addition to deviations from ideality, changes in device characteristics through normal device operation are difficult to manage for practical applications. The value of μ, which represents the device current-driving capability, should be constant after multiple bias-sweeps so that the measured current at a particular voltage is invariant. Similarly, the V T drift (ΔV T ) should be minimized during device operation (i.e., a device should not be ON at a particular voltage and then switch to OFF at the same voltage), and the on/off ratio (I ON /I OFF ) should remain high to give well-defined ON and OFF states.
Many high charge carrier mobility (μ) active layers within organic fieldeffect transistor (OFET) configurations exhibit non-linear current-voltage characteristics that may drift with time under applied bias and, when applying conventional equations for ideal FETs, may give inconsistent μ values.This study demonstrates that the introduction of electron deficient fullerene acceptors into thin films comprised of the high-mobility semiconducting polymer PCDTPT suppresses an undesirable "double-slope" in the currentvoltage characteristics, improves operational stability, and changes ambipolar transport to unipolar transport. Examinatio...