2006
DOI: 10.1063/1.2349290
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High mobility n-type thin-film transistors based on N,N′-ditridecyl perylene diimide with thermal treatments

Abstract: The authors demonstrated that N , NЈ-ditridecyl-3,4,9,10-perylenetetracarboxylic diimide ͑PTCDI-C13͒ thin-film transistors ͑TFTs͒ exhibited high field-effect electron mobility of 2.1 cm 2 / V s by just annealing at an adequate temperature ͑140°C͒ after the TFT fabrications. While PTCDI-C13 formed c-axis oriented thin films, the thermal treatments improved crystallinity of the thin films as revealed by x-ray diffraction. The thermal treatment also affected thin-film morphologies; the morphologies changed from o… Show more

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Cited by 266 publications
(261 citation statements)
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“…Actually for some Ar 2 Tz halogenated derivatives, the calculated electronic coupling values appear to be of the same order of magnitude than those reported before for the best naphthalene diimide 19 and perylene n-type semiconductors, 20,21 which have been successfully used in electronic devices. [22][23][24][25][26] Nevertheless, the high values of internal reorganization energy (λ i ) predicted for those Ar 2 Tz derivatives might preclude their use as reliable semiconducting materials.…”
supporting
confidence: 73%
“…Actually for some Ar 2 Tz halogenated derivatives, the calculated electronic coupling values appear to be of the same order of magnitude than those reported before for the best naphthalene diimide 19 and perylene n-type semiconductors, 20,21 which have been successfully used in electronic devices. [22][23][24][25][26] Nevertheless, the high values of internal reorganization energy (λ i ) predicted for those Ar 2 Tz derivatives might preclude their use as reliable semiconducting materials.…”
supporting
confidence: 73%
“…This value is very close to that of vacuum deposited PTCDI-C13 films, 5.4×10 -3 cm 2 /Vs [32]. Moreover, the threshold voltages are also very close, 47 V vs. 44 V. This result means that PTCDI-C13 nanoparticle films deposited by drop-casting method using colloids can be used as good active layers of OTFTs.…”
Section: (B) and (C) Show Representative Output Characteristics And Tsupporting
confidence: 77%
“…The grain growth, however, is not as large as expected. In the case of vacuum deposited films, the grain size increased dramatically by post-annealing treatment up to a few micrometers which results in very high electron mobility of 2.1 cm 2 /Vs [32]. In this case, the increased grain size is still an order of several hundred nanometers which results in somewhat low mobility of 0.027 cm 2 /Vs.…”
Section: (B) and (C) Show Representative Output Characteristics And Tmentioning
confidence: 99%
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