2003
DOI: 10.1109/lpt.2003.811339
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High optical responsivity of InAlAs-InGaAs metamorphic high-electron mobility transistor on GaAs substrate with composite channels

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Cited by 51 publications
(21 citation statements)
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“…While under the illumination at 1550 nm, as the MoS 2 layer is transparent to NIR light, the photogenerated electrons and holes only appear in the InGaAs channel. The measured transfer curve (the red curve) in Figure b exhibits a leftward shift, which indicates a positive photoresponse in a traditional InGaAs‐based HEMT . Such a photoelectric characteristic has also been shown in the I d – V d output curves in Figure c.…”
supporting
confidence: 53%
“…While under the illumination at 1550 nm, as the MoS 2 layer is transparent to NIR light, the photogenerated electrons and holes only appear in the InGaAs channel. The measured transfer curve (the red curve) in Figure b exhibits a leftward shift, which indicates a positive photoresponse in a traditional InGaAs‐based HEMT . Such a photoelectric characteristic has also been shown in the I d – V d output curves in Figure c.…”
supporting
confidence: 53%
“…In the PV effect, photogenerated holes flow to the drain electrode, while negative charges accumulate under the source electrode, reducing the barrier height for hole injection and, thus, the contact resistance. 24 This leads to a positive shift in V th . At 680 nm, there is a sublinear dependence of R ph on P opt , i.e., R ph / P À0:9 , which likely comes from enhanced singlet-singlet exciton annihilation, due to higher density of photogenerated excitons at increasing optical power [ Fig.…”
Section: -mentioning
confidence: 99%
“…The accumulated negative carriers can effectively reduce the injection barrier of holes at the source electrode. The lowered injection barrier induced by light irradiation results in an effective decrease in contact resistance and in a positive shift of V Th , and thereby in a significant increase in I d 45–47. Moreover, photogenerated electrons can also be trapped at the semiconductor/dielectric interface by electron‐capturing moieties, such as hydroxyl groups on SiO 2 dielectric layer or other sources.…”
Section: Operation Mechanismsmentioning
confidence: 99%
“…Moreover, photogenerated electrons can also be trapped at the semiconductor/dielectric interface by electron‐capturing moieties, such as hydroxyl groups on SiO 2 dielectric layer or other sources. The photocurrent caused by the photovoltaic effect can be expressed as Equation (1):45, 46 where η is the photogeneration quantum efficiency, P opt the incident optical power, I pd the dark current for minority charges, hc /λ the photon energy, g m the transconductance, ΔV Th the threshold voltage shift, and A a proportionality parameter 48…”
Section: Operation Mechanismsmentioning
confidence: 99%