Abstract:This paper reports on the demonstration of microwave power performance at 30 GHz on InAlN/GaN metal-insulator-semiconductor high electron mobility transistor (MISHEMT) on silicon substrate by using the Hf0.5Zr0.5O2 (HZO) as a gate dielectric. Compared with Schottky gate HEMT (SG-HEMTs), the MISHEMT with a gate length (LG) of 50 nm presents a significantly enhanced performance with an ON/OFF current ratio (ION/IOFF) of 9.3 × 107, a subthreshold swing (SS) of 130 mV/dec, a low drain-induced barrier lowing (DIBL)… Show more
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