DOI: 10.32657/10356/46322
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High performance nano-scale measurements by advanced atomic force estimation

Abstract: Atomic force microscopy (AFM) was invented by G. Binnig and his collaborators in 1986 after the invention of scanning tunnelling microscopy (STM) in the early 1980s. The AFM system deploys a tiny probe to interact with the sample such that topography information of the sample can be obtained. The resolutions of the AFM topography images are in the nanometer scale and they are limited only by the probe diameters. Besides, in AFM imaging, there is no requirement on sample preparation and conductivity. Thus, the … Show more

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