2012 4th IEEE International Memory Workshop 2012
DOI: 10.1109/imw.2012.6213668
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High Performance Nanocrystal Based Embedded Flash Microcontrollers with Exceptional Endurance and Nanocrystal Scaling Capability

Abstract: In this paper, we present the first-ever commercially available embedded Microcontrollers built on 90nm-node with silicon nanocrystal memories that has intrinsic capability of exceeding 500K program/erase cycles. We also show that the cycling performance across temperature (-40C to 125C) is very well behaved even while maintaining high performance that meets or exceeds the requirements of consumer, industrial, and automotive markets. In specific EEPROM implementation, such high endurance is capable of deliveri… Show more

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Cited by 8 publications
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“…Traditional dual-poly [2] and split-gate [3], [4] eFlash technologies are optimized for high-density nonvolatile code and data storage applications. The former employs a floating gate (FG) device while the latter utilizes charge trap material for achieving nonvolatile storage.…”
Section: Introductionmentioning
confidence: 99%
“…Traditional dual-poly [2] and split-gate [3], [4] eFlash technologies are optimized for high-density nonvolatile code and data storage applications. The former employs a floating gate (FG) device while the latter utilizes charge trap material for achieving nonvolatile storage.…”
Section: Introductionmentioning
confidence: 99%