Understanding the thermal stability of the Mg 2 (Si,Sn) system is essential to define their safe temperatures of service. Despite its good thermoelectric performance, Mg 2 (Si,Sn) is subject to a phase separation during thermal cycling due to the miscibility gap, which leads to a degradation of its thermoelectric properties and affects its performance during device operation. Isothermal annealing at 500 C and 750 C were performed with different annealing time to investigate thermal stability of Mg 2 (Si,Sn). During the heat treatment, two phases were formed associated with porosity in the matrix. In addition, thickness of specimen was tracked and a significant expansion was detected. This phenomenon is attributed to the Kirkendall effect. The composition and the structure of the two forming phases were investigated by electron probe microanalysis and X-ray diffraction. Finally, the optimized thermal treatment allowed to stabilize the Mg 2 (Si,Sn) without porosity and the presence of two thermodynamically stabilized phase (Mg 2 Si 0.41 Sn 0.59 and Mg 2 Si 0.58 Sn 0.42) leading to a better reliability of the silicide thermoelectric modules.