“…However, most a-InGaZnO TFTs reported so far with conventional gate dielectric materials (i.e., SiO 2 ) were operated at high operation voltages over 20 V to obtain high field-effect mobility and on-off ratios [11][12][13][14] because of the relatively low dielectric constant limiting the maximum accumulated carrier density (<10 13 cm −2 ). [15,16] To overcome these difficulties and realize the low-voltage operation, there have been many different approaches on developing new gate dielectrics, including high-dielectric constant (high-k) oxide materials, [17] hybrid multicomponent, [18] ionic liquid, [19] poly mer electrolyte, [20] and solid electrolyte. [21] Among these, the gate dielectric forming the electric double layer (EDL) using an ionic polymer, [22][23][24] comprising ionic liquids in a polymer matrix, has been extensively studied, thanks to its advantages of induced ultrahigh density carrier attainability in the channel, improved capacitive coupling, low-voltage operation, and lowtemperature fabrication process.…”