2011
DOI: 10.1149/1.3610345
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High-Performance Vertical Light-Emitting Diodes with Buried Current Blocking Layer and Non-Alloyed Reflective Cr/Al/Pt/Au n-type Electrodes

Abstract: A GaN-based vertical light-emitting diode (VLED) with a novel structure, consisting of a buried current blocking layer (BCBL) inserted in p-type GaN and non-alloyed reflective n-type electrodes (Cr/Al/Pt/Au) on N-face n-GaN, is proposed and its enhanced light extraction efficiency is demonstrated. It was found that this new VLED structure could significantly increase the light output power by about 16% compared to that of the conventional VLED chips with n-type Cr/Au electrodes and without the BCBL, although t… Show more

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Cited by 8 publications
(3 citation statements)
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“…7(b), increased by more than 4 times with increasing V GS from −4 to −3 V at a V DD of 3.5 V. Furthermore, the on-state resistance (R on ) of the high-power dimmable VI-LEDs by integration with HFETs decreased from 15 to 8.7 Ω with increasing V GS form −3.5 to −3 V by using a linear extrapolation method, which can be due to the reduced resistance of 2DEG with increasing V GS from −3.5 to −3 V. 28) It is worth noting that the LOP of the VI-LEDs was as high as 379 mW at V GS of −3 V and V DD of 5 V for HFET, which is more than two orders of magnitude higher value than the previously reported LOP of monolithically integrated LED with HFET using SEG (1 mW at V GS of −3 V and V DD of 5 V). 19,20) This result can be attributed to the high forward current of 270 mA for the hybrid integration of VI-LED with HFET when compared to that of only 15 mA for the monolithically integrated LEDs with HFET. 29,30) This implies that the high-power dimmable GaN-based VI-LEDs can be realized through hybrid integration of VI-LED with AlGaN/GaN HFET, which is promising candidate for novel applications such as underwater VLC and adaptive headlights for vehicles.…”
Section: Resultsmentioning
confidence: 99%
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“…7(b), increased by more than 4 times with increasing V GS from −4 to −3 V at a V DD of 3.5 V. Furthermore, the on-state resistance (R on ) of the high-power dimmable VI-LEDs by integration with HFETs decreased from 15 to 8.7 Ω with increasing V GS form −3.5 to −3 V by using a linear extrapolation method, which can be due to the reduced resistance of 2DEG with increasing V GS from −3.5 to −3 V. 28) It is worth noting that the LOP of the VI-LEDs was as high as 379 mW at V GS of −3 V and V DD of 5 V for HFET, which is more than two orders of magnitude higher value than the previously reported LOP of monolithically integrated LED with HFET using SEG (1 mW at V GS of −3 V and V DD of 5 V). 19,20) This result can be attributed to the high forward current of 270 mA for the hybrid integration of VI-LED with HFET when compared to that of only 15 mA for the monolithically integrated LEDs with HFET. 29,30) This implies that the high-power dimmable GaN-based VI-LEDs can be realized through hybrid integration of VI-LED with AlGaN/GaN HFET, which is promising candidate for novel applications such as underwater VLC and adaptive headlights for vehicles.…”
Section: Resultsmentioning
confidence: 99%
“…This study focused on the realization of high-power dimmable GaN-based LED light sources with a small form factor by hybrid integration with AlGaN/GaN HFETs. For this purpose, the hybrid integration of GaN-based verticalinjection LEDs (VI-LEDs) with AlGaN/GaN-based HFETs having multi-level metallization via the flip-chip bonding technique was examined, because VI-LEDs can yield a high power over 100 mW at a forward current of 100 mA [16][17][18][19][20] and AlGaN/GaN-based HFETs with multi-level metallization can give a high current over 1 A at V GS of 1 V and V DS of 2 V with much smaller form factor than the conventional HFETs. [21][22][23] Furthermore, the flip-chip bonding method will not reduce the efficiency of the integrated LED and HFET devices because it does not apply the SEG and SER processes.…”
Section: Introductionmentioning
confidence: 99%
“…The low-cost fabrication of high-efficiency LED chips is considered as a fundamental requirement for GaN-based solid-state lighting. Many approaches have been studied in order to meet these requirements, such as epitaxial growth on largearea silicon substrates, the use of non-polar sapphire substrates, and advanced chip designs, like vertical chips [2][3][4][5][6]. Poor quality of the p-type GaN layer is one of the main obstacles that hinder the achievement of high efficiency.…”
Section: Introductionmentioning
confidence: 99%