2022
DOI: 10.1016/j.jallcom.2021.162924
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High power impulse magnetron sputtering growth processes for copper nitride thin film and its highly enhanced UV - visible photodetection properties

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Cited by 15 publications
(3 citation statements)
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“…On the other hand, the lattice parameters calculated were slightly higher than the theoretical parameters (0.38170 nm). This demonstrates the over-stoichiometry of the film in terms of N content, as other authors have previously reported [ 20 , 37 , 43 ]. With regard to the mean grain size calculated, no clear trend was observed in RF power for the different sample series of gas pressures, with the values being around 27–38 nm, similar to those obtained in the literature [ 9 , 32 , 37 ].…”
Section: Resultssupporting
confidence: 86%
See 1 more Smart Citation
“…On the other hand, the lattice parameters calculated were slightly higher than the theoretical parameters (0.38170 nm). This demonstrates the over-stoichiometry of the film in terms of N content, as other authors have previously reported [ 20 , 37 , 43 ]. With regard to the mean grain size calculated, no clear trend was observed in RF power for the different sample series of gas pressures, with the values being around 27–38 nm, similar to those obtained in the literature [ 9 , 32 , 37 ].…”
Section: Resultssupporting
confidence: 86%
“…On the other hand, the different natures observed in this material can be reached by modifying its deposition conditions and/or depending on the fabrication technique used. The differences in morphological, structural, chemical and optoelectronic properties reported in the literature are attributed to the vacant interstitial sites occupied by atoms other than Cu and the chemical interactions between them [ 20 , 21 , 22 ]. That is why the knowledge of its local atomic structure is of great importance; it permits the determination of the most suitable material that fits the device requirements.…”
Section: Introductionmentioning
confidence: 99%
“…These results clearly show the potential of Cu 3 N films deposited through HiPIMS technology to be applied in future optoelectronic devices. This technique helps in obtaining a flatter interface when the multilayer films are coated, which can improve the device performance [50].…”
Section: Discussionmentioning
confidence: 99%