1999
DOI: 10.1116/1.590697
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High pressure, high temperature scanning tunneling microscopy

Abstract: Articles you may be interested inA new scanning tunneling microscope reactor used for high-pressure and high-temperature catalysis studies Rev. Sci. Instrum. 79, 084101 (2008); A high pressure, high temperature, scanning tunneling microscope for in situ studies of catalysts Rev.The design and performance of a high pressure, high temperature scanning tunneling microscope ͑HPHT-STM͒ system is described. The system combines an ultrahigh vacuum surface analysis/ preparation chamber with a variable pressure (5ϫ10 Ϫ… Show more

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Cited by 61 publications
(37 citation statements)
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“…This result is in close agreement with the value of 0.36 nm reported by Meinel et al [9][10][11]. Our calculated value is equivalent to the (111) planes of face centered cubic ZrO 2 with a CaF 2 -like structure [9,15]. Because of the approximately 28% lattice misfit between ZrO 2 (111) and Pt(111), the (5×5) superstructure of Pt(111) observed at low coverage corresponds to the (4×4) superstructure of ZrO 2 (111), as described previously [11].…”
Section: Low Energy Electron Diffractionsupporting
confidence: 82%
“…This result is in close agreement with the value of 0.36 nm reported by Meinel et al [9][10][11]. Our calculated value is equivalent to the (111) planes of face centered cubic ZrO 2 with a CaF 2 -like structure [9,15]. Because of the approximately 28% lattice misfit between ZrO 2 (111) and Pt(111), the (5×5) superstructure of Pt(111) observed at low coverage corresponds to the (4×4) superstructure of ZrO 2 (111), as described previously [11].…”
Section: Low Energy Electron Diffractionsupporting
confidence: 82%
“…[195][196][197][198][199][200][201][202][203][204][205][206] Table 4 lists the principal characterization techniques that can be used at high pressures and temperatures at the solid-gas interface and also at solid-liquid interfaces with references to key review papers. Among these, sum frequency generation (SFG)-surface vibrational spectroscopy 199 (e.g., Figure 12) and the scanning probe microscopies (scanning tunneling microscopy [STM] (e.g., Figure 13) and atomic force microscopy [AFM]) 202 have the sensitivities to be applicable for studies on small area (∼1 cm 2 ) catalysts. Adsorption-reflection infrared spectroscopy 197 and synchrotron-based techniques (grazing angle X-ray diffraction and X-ray absorption) 204 can also be used for external surfaces with small areas.…”
Section: B In Situ Molecular Characterization Techniquesmentioning
confidence: 99%
“…After transferring the sample to the reactor chamber, valves are closed and gases are introduced to a high pressure. The capabilities of the instrument are described elsewhere [2,3].…”
mentioning
confidence: 99%