1998
DOI: 10.4131/jshpreview.7.327
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High Pressure Structural Phase Transition in AgGaTe2.

Abstract: The high pressure X-ray diffraction pattern of AgGaTe2 chalcopyrite semiconductor has been measured up to 18GPa. It

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Cited by 4 publications
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“…Here, we show an alternative route to fabricate nanostructured thermoelectric materials by room-temperature high-pressure synthesis. Chalcopyrite and related compounds exhibit pressure-induced structural modification. Structural modification of CuInTe 2 occurs at 3.6 GPa with transformation into the cation site disordered Cmcm (d- Cmcm ) structure . In this study, we discovered that the high-pressure phase of CuInTe 2 is not stable at ambient pressure.…”
Section: Introductionmentioning
confidence: 82%
“…Here, we show an alternative route to fabricate nanostructured thermoelectric materials by room-temperature high-pressure synthesis. Chalcopyrite and related compounds exhibit pressure-induced structural modification. Structural modification of CuInTe 2 occurs at 3.6 GPa with transformation into the cation site disordered Cmcm (d- Cmcm ) structure . In this study, we discovered that the high-pressure phase of CuInTe 2 is not stable at ambient pressure.…”
Section: Introductionmentioning
confidence: 82%
“…Phase transitions have also been observed in other crystals of this group. At 3-4 Gpa, AgInTe 2 transforms into a cation-disordered orthorhombic structure with space group Cmcm [19], as well as 12.7 GPa for CuGaTe 2 and at 3.6 GPa for the CuInTe 2 crystal and others [20][21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%