2018
DOI: 10.1088/1361-6501/aab998
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High quality-factor quartz tuning fork glass probe used in tapping mode atomic force microscopy for surface profile measurement

Abstract: This paper presents a high quality-factor (Q-factor) quartz tuning fork (QTF) with a glass probe attached, used in frequency modulation tapping mode atomic force microscopy (AFM) for the surface profile metrology of micro and nanostructures. Unlike conventionally used QTFs, which have tungsten or platinum probes for tapping mode AFM, and suffer from a low Q-factor influenced by the relatively large mass of the probe, the glass probe, which has a lower density, increases the Q-factor of the QTF probe unit allow… Show more

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Cited by 9 publications
(10 citation statements)
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“…In the spring model, let the spring constant be 𝑘, and the mass 𝑚, then the eigenfrequency 𝑓 of spring mechanical vibration is [11] :…”
Section: Theoretical Background and Estimation Of Qtf Parametersmentioning
confidence: 99%
See 4 more Smart Citations
“…In the spring model, let the spring constant be 𝑘, and the mass 𝑚, then the eigenfrequency 𝑓 of spring mechanical vibration is [11] :…”
Section: Theoretical Background and Estimation Of Qtf Parametersmentioning
confidence: 99%
“…QTF has been widely used as a force sensor in atomic force microscopy (AFM) [7][8][9][10][11][12][13][14][15][16][17] . AFM usually utilises a micro-cantilever probe for laser detecting in its measurement and scanning imaging.…”
Section: Introductionmentioning
confidence: 99%
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