2017
DOI: 10.1063/1.5006673
|View full text |Cite
|
Sign up to set email alerts
|

High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering

Abstract: High-quality single-crystal thulium iron garnet (TmIG) films of 10-30 nm thick were grown by off-axis sputtering at room temperature (RT) followed by post-annealing. X-ray photoelectron spectroscopy (XPS) was employed to determine the TmIG film composition to optimize the growth conditions, along with the aid of x-ray diffraction (XRD) structural analysis and atomic force microscope (AFM) for surface morphology. The optimized films exhibited perpendicular magnetic anisotropy (PMA) and the saturation magnetizat… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

4
26
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 31 publications
(30 citation statements)
references
References 15 publications
4
26
0
Order By: Relevance
“…Out-of-plane lattice constants of samples A, B, C and E were 12.274 Å, 12.289 Å, 12.299 Å and 12.302 Å, respectively. The gradual increase of the out-of-plane lattice constant reflected a Tm-richer composition as L increased, consistent with the previous composition investigation 13 . The Tm: Fe ratio of samples are determined by Rutherford backscattering spectrometry (RBS) and X-ray photoelectron spectroscopy (XPS) in the Supplementary information S1.…”
Section: Resultssupporting
confidence: 91%
See 2 more Smart Citations
“…Out-of-plane lattice constants of samples A, B, C and E were 12.274 Å, 12.289 Å, 12.299 Å and 12.302 Å, respectively. The gradual increase of the out-of-plane lattice constant reflected a Tm-richer composition as L increased, consistent with the previous composition investigation 13 . The Tm: Fe ratio of samples are determined by Rutherford backscattering spectrometry (RBS) and X-ray photoelectron spectroscopy (XPS) in the Supplementary information S1.…”
Section: Resultssupporting
confidence: 91%
“…Figure 1 shows the structural and magnetic properties of the optimized off-axis sputtered TmIG thin film on GGG(111) with a longitudinal distance of 7 cm 13 . The cross-sectional TEM image and the energy-dispersive X-ray spectroscopy (EDS) element mapping images shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The RE:Fe ratio exceeds 0.6 in both cases, with values of 0.72 for EuIG (001) and 0.70 for TbIG. This iron deficiency is consistent with similar XPS analyses of sputtered TmIG films and PLD-grown YIG films, which showed Y:Fe ratios as large as 1.37 [27,33].…”
Section: Structural and Magnetic Characterizationsupporting
confidence: 87%
“…Other thin film RE garnets include GdIG (Gd 3 Fe 5 O 12 ) [25] and LuIG (Lu 3 Fe 5 O 12 ) [26] with in plane easy axis. Out of the PMA RE garnets, TmIG is the most extensively studied in terms of the spintronic properties of the FMI/HM interface [19,[27][28][29][30]. TmIG/HM devices exhibited SOT-driven reversal with applied fields as low as 2 Oe and evidence of fast current-induced domain wall velocities reaching 1000 m/s at a current density of 2.5 × 10 12 A/m 2 in the Pt [28].…”
Section: Introductionmentioning
confidence: 99%