2005
DOI: 10.1088/0953-2048/18/7/l01
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High quality superconducting niobium films produced by an ultra-high vacuum cathodic arc

Abstract: The vacuum arc is a well-known technique to produce coating with enhanced adhesion and film density. Many cathodic arc deposition systems are actually in use in industry and research. They all work under (high) vacuum conditions in which water vapor pressure is an important source of film contamination, especially in the pulsed arc mode of operation. Here we present a Cathodic Arc system working under Ultra High Vacuum conditions (UHVCA).UHVCA has been used to produce ultra-pure niobium films with excellent st… Show more

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Cited by 32 publications
(27 citation statements)
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“…Due to a relatively small film thickness X-rays are not all stopped in the niobium film but also penetrate the substrate. When the substrate is copper they produce The superconducting critical temperatures T c have been measured using an inductive technique described elsewhere [20]. Results range from 9.20K to 9.32K with a transition width always less than 0.02K, in good agreement with Nb bulk data (T c = 9.26K ∆T c ∼ 0.01K); a few typical transitions are shown in Fig.5.…”
Section: Results On Niobium Filmssupporting
confidence: 59%
“…Due to a relatively small film thickness X-rays are not all stopped in the niobium film but also penetrate the substrate. When the substrate is copper they produce The superconducting critical temperatures T c have been measured using an inductive technique described elsewhere [20]. Results range from 9.20K to 9.32K with a transition width always less than 0.02K, in good agreement with Nb bulk data (T c = 9.26K ∆T c ∼ 0.01K); a few typical transitions are shown in Fig.5.…”
Section: Results On Niobium Filmssupporting
confidence: 59%
“…UHV sources are not commercially available, although a couple other groups have presented designs for UHV cathodic arc sources. [26][27][28][29] Our design is highlighted in Figs. 4(a)-4(e).…”
Section: Cathodic Arc Chamber Lid Features (Figures 4(a)-4(e))mentioning
confidence: 99%
“…T c = 9.26 K, ΔT c = 0.02 K and J c = 3x10 7 A/cm 2 [10]. Scanning Electron Microscopy (SEM) is a very useful tool to perform the surface quality inspection for small-scale defects and to look at the surface structure.…”
Section: Formation and Properties Of Uhv Arc-deposited Supercondmentioning
confidence: 99%