2010
DOI: 10.1016/j.tsf.2009.12.023
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High quality ZnO films deposited by radio-frequency magnetron sputtering using layer by layer growth method

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Cited by 55 publications
(18 citation statements)
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“…Figure 2a shows a scanning electron microscope (SEM) photo of a 4 μm thick ZnO thin film as an example. It can be seen that the ZnO film consists of highly-oriented columnar nanograins perpendicular to the substrate, a growth result similar to what has been previously achieved on Si substrates2829. X-ray diffraction (XRD) characterization reveals that the (0002) ZnO crystal orientation dominates the crystal orientation (Figure 2b).…”
Section: Resultssupporting
confidence: 83%
“…Figure 2a shows a scanning electron microscope (SEM) photo of a 4 μm thick ZnO thin film as an example. It can be seen that the ZnO film consists of highly-oriented columnar nanograins perpendicular to the substrate, a growth result similar to what has been previously achieved on Si substrates2829. X-ray diffraction (XRD) characterization reveals that the (0002) ZnO crystal orientation dominates the crystal orientation (Figure 2b).…”
Section: Resultssupporting
confidence: 83%
“…In the Raman spectra of ZnO nanoneedles ( Figure 5), there is a well-known intense E2 low phonon band at 98.9 cm −1 (FWHM ≈ 5.3 cm −1 ) and a E2 high phonon band at 437 cm −1 (FWHM ≈ 9.5 cm −1 ) associated with the motion of Zn and O sublattices, respectively [12]. These small FWHM magnitudes of E2 Low and E2 High modes confirm the wurtzite ZnO structure for nanoneedles deposited by MEE using concentrated solar radiation [13,14]. The position of the E2 high band at 437 cm −1 corresponds to the phonons of a bulk ZnO crystal [15], indicating a strain-free state of the nanoneedles.…”
Section: Sem Images Ofmentioning
confidence: 52%
“…The FWHM of the peak in the XRD curve is 0.152° for the 4 μm ZnO film, comparable to those obtained from solid substrates. Figure 2(b) is the SEM image of the cross-section of the ZnO film, clearly showing that ZnO thin film is highly (0002) oriented, columnar structured nanocrystal grains perpendicular to the substrate, not different from those deposited on the Si-substrates [18]. The grain size can be estimated using the Debye-Scherrer formula [17], and the result is shown in Fig.…”
Section: Resultsmentioning
confidence: 96%