High-resolution ARPES endstation for in situ electronic structure investigations at SSRF

Abstract

Angle-resolved photoemission spectroscopy (ARPES) is one of the most powerful experimental techniques in condensed matter physics. Synchrotron ARPES, which uses photons with high flux and continuously tunable energy, has become particularly important. However, an excellent synchrotron ARPES system must have features such as a small beam spot, super-high energy resolution, and a user-friendly operation interface. A synchrotron beamline and an endstation (BL03U) were designed and constructed at the Shanghai Synchrotron Radiation Facility. The beam spot size at the sample position is 7.5 (V) lm 9 67 (H) lm, and the fundamental photon range is 7-165 eV; the ARPES system enables photoemission with an energy resolution of 2.67 meV at 21.2 eV. In addition, the ARPES system of this endstation is equipped with a six-axis cryogenic sample manipulator (the lowest temperature is 7 K) and is integrated with an oxide molecular beam epitaxy system and a scanning tunneling microscope, which can provide an advanced platform for in situ characterization of the fine electronic structure of condensed matter.

Evidence of high-temperature exciton condensation in a two-dimensional semimetal

“…ZrTe 2 thin films were grown in situ in the integrated MBE/ARPES systems at the laboratory at Shanghai Jiao Tong University, beamlines 10.0.1 at Advanced Light Sources in Lawrence Berkeley National Laboratory, and beamline 13U at National Synchrotron Radiation Lab in Hefei. Samples were transferred via a vacuum suitcase to beamline 03U at Shanghai Synchrotron Radiation Facility 42 . Substrates of 4H-SiC were flash-annealed for multiple cycles to form a well-ordered bilayer graphene on the surface.…”

Observation of nontrivial topological electronic structure of orthorhombic SnSe

“…Synchrotron-based ARPES measurements were performed at beamline 13U of the National Synchrotron Radiation Laboratory (NSRL), China, and beamline 03U of the Shanghai Synchrotron Radiation Facility (SSRF), China [43]. The samples were cleaved in situ and measured under ultra-high vacuum below 5×10 -11 Torr.…”

Direct Observation of the Topological Surface State in the Topological Superconductor 2M-WS2

“…ARPES measurements were performed at the 03U beamline of Shanghai Synchrotron Radiation Facility (SSRF) . The end-station was equipped with a Scienta-Omicron DA30 electron analyzer.…”

“…ARPES measurements were performed at the 03U beamline of Shanghai Synchrotron Radiation Facility (SSRF). 45 The endstation was equipped with a Scienta-Omicron DA30 electron analyzer. The angular and energy resolutions were set to 0.2°a nd 8−20 meV (dependent on the selected probing photon energy).…”