1993
DOI: 10.1016/0022-0248(93)90445-3
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High-resolution electron microscopy of epitaxial layers and interfaces in the CaF2/Si(100) and CaF2/Si/CaF2/Si(100) heterosystems

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“…10. A transition layer from ͑100͒ to ͑111͒ can be observed in the first grown 1.6-nm-thick CaF 2 layer as reported in Ref.…”
supporting
confidence: 69%
“…10. A transition layer from ͑100͒ to ͑111͒ can be observed in the first grown 1.6-nm-thick CaF 2 layer as reported in Ref.…”
supporting
confidence: 69%