High resolution flat crystal spectrometer for the Shanghai EBIT

Xiao, Jun; Gao, Yuan; Zhang, X.; Lu, D. C.; Hu, Wei; Gao, M.; Chen, W.; Zou, Yaming

doi:10.1063/1.2970942

Cited by 12 publications

(4 citation statements)

References 33 publications

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“…12 Conversely, it is also possible to prepare the otherwise disturbing satellite transitions also in a targeted way, using well-defined, monoenergetic excitation conditions. 13,14 Moreover, EBIT spectral line positions are not affected by Doppler shifts on the level of accuracy achieved in x-ray crystal spectroscopy [15][16][17][18] at accelerators.…”

Section: Introductionmentioning

confidence: 99%

High-precision laser-assisted absolute determination of x-ray diffraction angles

Kubiček

Braun

Bruhns

et al. 2012

Review of Scientific Instruments

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A novel technique for absolute wavelength determination in high-precision crystal x-ray spectroscopy recently introduced has been upgraded reaching unprecedented accuracies. The method combines visible laser beams with the Bond method, where Bragg angles (θ and -θ) are determined without any x-ray reference lines. Using flat crystals this technique makes absolute x-ray wavelength measurements feasible even at low x-ray fluxes. The upgraded spectrometer has been used in combination with first experiments on the 1s2p(1)P(1) → 1s(2)(1)S(0) w-line in He-like argon. By resolving a minute curvature of the x-ray lines the accuracy reaches there the best ever reported value of 1.5 ppm. The result is sensitive to predicted second-order QED contributions at the level of two-electron screening and two-photon radiative diagrams and will allow for the first time to benchmark predicted binding energies for He-like ions at this level of precision.

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Section: Introductionmentioning

confidence: 99%

High-precision laser-assisted absolute determination of x-ray diffraction angles

Kubiček

Braun

Bruhns

et al. 2012

Review of Scientific Instruments

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“…To enhance the reliability of intensity measurements, the two-dimensional pixel count arrays obtained through CCD accumulation were reconstructed by photonization and filtered by count threshold using a data processing program. This program can significantly improve the signal-to-noise ratio of the spectra, thus it has been widely employed in X-ray spectroscopy measurements in our laboratory [71,72]. In the spectral processing for these experiments, count thresholds were set according to the principle of less intensity loss and baseline normalization.…”

Section: Methodsmentioning

confidence: 99%

X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations

Huang,

Tang,

Yang

et al. 2024

Applied Sciences

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The X-ray spectra of L-shell transitions in Neon-like Xenon ion (Xe44+) have been precisely measured at the Shanghai Electron-Beam Ion Trap using a high-resolution crystal spectrometer. Focusing on the line-intensity ratio of the 3F {2p6-(2p51/23s1/2)J=1} and 3D {2p6-(2p53/23d5/2)J=1} lines (3F/3D), our measurements have achieved remarkable precision improvements over the previous studies. These spectra have been simulated using the collisional-radiative model (CRM) within the Flexible Atomic Code, showing good agreement with the measurements. The previously reported discrepancies, approximately ranging from 10% to 20%, have been significantly reduced in this work to below 1.4% for electron-beam energies exceeding 6 keV and to around 7% for lower energies. Furthermore, our analysis of population fluxes of the involved levels reveals a very high sensitivity of the 3F line to radiation cascades. This suggests that the current CRM, which conventionally excludes interionic population transfer processes, may underestimate the population of the upper level of the 3F line and the cascade-related higher levels, thus explaining the remaining discrepancies. These findings provide a solid foundation for further minimizing these discrepancies and are crucial for understanding the atomic structure and plasma model of these ions.

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“…In practice, however, such a diverse set of metrics is difficult to achieve, both the short-and long-wavelength limitations are constrained by the stringent geometrical restrictions. Furthermore, in order for the diffracted x-rays to fall on the detector, the crystal rotation angle 𝛿𝜃 𝐵 must be accompanied by the detector rotation angle 2𝛿𝜃 𝐵 , necessitating the placement of the crystal and the detector in an ultra-large vacuum chamber [39]. This poses a significant challenge to the vacuum, transmission, and control systems of the spectrometer, and in many cases, such a large spectrometer cannot be placed on the experimental site.…”

Section: Spectrometer Design 21 Principle Of the Spectrometermentioning

confidence: 99%

A wide-band, high-resolution vacuum flat crystal spectrometer for LEAF facility

et al. 2023

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A wide-band, high-resolution vacuum flat-crystal spectrometer was developed for analyzing the x-rays spectra of hollow atoms. The spectrometer was designed to cover an energy dynamic range of 0.6 to 16 keV by combining different flat crystals and an x-ray CCD detector mounted on a twistable bellows that could modulate the Bragg angles ranging from 25° to 50°.The performance of the spectrometer was evaluated in energy range of 3–12 keV by measuring the K and L x-rays generated by 10–30 keV electron beam collisions with solid titanium, silver and gold targets, respectively. The typical resolving power of the spectrometer is estimated to be around 103, with a single exposure measurement range of 144–1411 eV and corresponding energy resolution of 3.5–33.2 eV. This spectrometer could be utilized to investigate the fine hyper-satellite line structure of hollow atoms with 10 ≤ Z ≤ 26.

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High resolution flat crystal spectrometer for the Shanghai EBIT

Cited by 12 publications

References 33 publications

High-precision laser-assisted absolute determination of x-ray diffraction angles

High-precision laser-assisted absolute determination of x-ray diffraction angles

X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations

A wide-band, high-resolution vacuum flat crystal spectrometer for LEAF facility

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