2004
DOI: 10.1051/epjap:2004029
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High resolution microscopy techniques for the analysis of biological samples: a comparison

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Cited by 12 publications
(8 citation statements)
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“…The contrast, on both SI and SE images is topographic (Ohya & Ishitani, 2003b; Milani et al ., 2004). In some regions there are pronounced differences in contrast between the two images (compare Fig.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…The contrast, on both SI and SE images is topographic (Ohya & Ishitani, 2003b; Milani et al ., 2004). In some regions there are pronounced differences in contrast between the two images (compare Fig.…”
Section: Discussionmentioning
confidence: 99%
“…In the life sciences, applications of SIM for structure analysis are scarce (Ballerini et al ., 1997; Drobne et al ., 2004; Milani et al ., 2004). Ion imaging of biological material is related to mass spectrometry providing images of elements and organic substances (Mony & Larras‐Regard, 1997; Almqvist et al ., 2001; Chandra, 2003; Okabe et al ., 2003; Takaya et al ., 2003, 2004).…”
Section: Introductionmentioning
confidence: 99%
“…Small defined areas of the cuticular surface of mites were removed by ion etching to allow examination of the underlying structures. The first documentation of a successful application of the FIB for in situ sample preparation and microscopy of cells is the work of Ballerini et al 1 A comparison of the performances of a FIB machine, TEM, SEM, 14 and soft x-ray contact microscopy ͑SXCM͒ 8,15-18 is presented by Milani et al 19 Up to now, the FIB operation was done on Saccharomyces cerevisiae, Candida albicans, mites of the genus Halarachne, bacteria, human chondrocytes, lymphocytes, oocytes, and on a single gut epithelial cell. [1][2][3][4][5][6][7]20,21 Although the authors pointed out many advantages of the use of the FIB in biomedicine, up to now no experimental data existed on the in situ sample preparation and application of the SIM and/or SEM to gross morphology and cell ultrastructure inspection of the very same sample.…”
Section: Introductionmentioning
confidence: 99%
“…If the sample is nonconductive, a low energy electron flood gun can be used for providing charge neutralization. Therefore, by using the positive primary ion beam, highly insulating samples may be imaged and milled without a surface coating by a conducting material, as it would be required in a SEM (Ballerini et al 1997;Drobne et al 2004, Milani et al 2004a.…”
Section: Focused Ion Beammentioning
confidence: 99%