1997
DOI: 10.1117/1.601521
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High-resolution multidimensional displacement monitoring system

Abstract: The possibility of using quadrant detectors to develop a new optical system that can monitor all six degrees of freedom of mechanical workpieces with very high resolution is investigated. A prototype system based on this approach has been designed and built. Although the system is not fully optimized, our proposed system has already demonstrated some promising results. Using a thermally compensated laser source together with a pinhole spatial filtering system, we have demonstrated that lateral resolution bette… Show more

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Cited by 26 publications
(11 citation statements)
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“…1 The same year, Lee et al used optics and a quadrant photo diode (QPD) to develop a five-DOF measurement system. 2 Linear resolution could be down to 50 nm, with an angular resolution 0.25 μrad. In 1998, Fan et al developed a six-DOF stage error compensation system.…”
Section: Introductionmentioning
confidence: 99%
“…1 The same year, Lee et al used optics and a quadrant photo diode (QPD) to develop a five-DOF measurement system. 2 Linear resolution could be down to 50 nm, with an angular resolution 0.25 μrad. In 1998, Fan et al developed a six-DOF stage error compensation system.…”
Section: Introductionmentioning
confidence: 99%
“…From the output signals of the PSDs, we can calculate the 3-D position and orientation of the three-facet mirror, thus enabling us to obtain the 3-D position and orientation of the objects. This method utilizes a small and light mirror, thus the mirror affects the dynamic characteristics of the object much less than that of Lee et al's method [4]. …”
mentioning
confidence: 98%
“…For the second method, it is difficult to fabricate a miniaturized reflective target 2 precisely and to measure the motion of a small object because it needs sufficient space for multiple reflective targets 3 or optical devices. 4 A new six-DOF measurement system using a diffraction grating target was proposed to overcome these problems. 5 Since this system uses several diffracted beams generated from a diffraction grating, it requires only one laser source and one cooperative target, which can simplify the structure of the measurement system.…”
Section: Introductionmentioning
confidence: 99%
“…One is using multiple interferometers for each axis 1 and the other is detecting the movement of beams reflected from cooperative targets. [2][3][4] Although the first method can obtain high resolution and decoupled information for each axis, it increases the size and complexity of a system and requires a high-quality reference mirror. Hence it is usually applied to control and calibration of precision stages.…”
Section: Introductionmentioning
confidence: 99%