High-resolution Raman microscopy of curled carbon nanotubes

Abstract

Patterned carbon nanotube assemblies with bent nanotube bundles were investigated with combined atomic force microscopy and confocal Raman imaging spectroscopy to identify conditions of carbon nanotubes in the bent state. We showed that the tangential G mode on Raman spectra systematically shifts downward upon nanotube bending as was predicted earlier. This lower frequency shift is attributed to the tensile stress, which results in the loosening of C–C bonds in the outer nanotube walls.

Electronic and vibrational properties of chemically modified single-wall carbon nanotubes

“…One reason for this high stability is the unusually high thermal conductivity of CNTs, which allows effective dissipation of the created heat. When combined with atomic force microscopy (AFM) [158,162] or transmission electron microscopy (TEM) [163], Fig. 15.…”

Freestanding Nanostructures via Layer‐by‐Layer Assembly

“…[27,28] The bulging test has also been conducted in combination with a confocal Raman setup to independently study conformational changes in LbL films subject to mechanical stress. [124] The observation of interference patterns (Newton's rings) as a function of applied pressure enables the deflection to be plotted versus the applied pressure (Fig. 13).…”

Robust Fluorescent Response of Micropatterned Multilayered Films

“…Time-dependent fluorescence was studied using a custom-designed confocal Raman-fluorescence instrument based on an Aurora-III near-field scanning optical microscope with a Nd:YAG laser (532 nm wavelength) as the excitation source as described elsewhere. [41] …”