2017
DOI: 10.1364/ol.42.002523
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High-resolution-scanning waveguide microscopy: spatial refractive index and topography quantification

Abstract: International audienceWe report on a high-resolution metal-clad waveguide scanning microscopic method with a diffraction-limited resolution. This microscope can be operated in both TM and TE waveguide modes with radially and azimuthally polarized beams, respectively, and allows both refractive index and topography of dielectric objects to be evaluated at high resolution and sensitivity. We emphasize the performance of this microscopic method from calibrated 3D polymer microstructures with rectangular, disk, an… Show more

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Cited by 3 publications
(3 citation statements)
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“…In recent years, surface plasmon resonance microscopy (SPRM) has developed tremendously. It has been used to study the cell–substrate adhesion ,, as well as dynamic cellular processes. ,, …”
mentioning
confidence: 99%
“…In recent years, surface plasmon resonance microscopy (SPRM) has developed tremendously. It has been used to study the cell–substrate adhesion ,, as well as dynamic cellular processes. ,, …”
mentioning
confidence: 99%
“…In order to improve the image contrast, M. G. Somekh et al introduced a Z-direction movement mechanism to the two-dimensional scanning mechanism. They found that if the sample is slightly shifted from the focus by about 1 µm, the image contrast (refractive index sensitivity) will be improved and the refractive index can be retrieved from the interference fringes [106,107]. In 2012, B. Zhang et al proposed a confocal system integrated scanning SPM, which provides a simpler and more stable alternative [108].…”
Section: Scanning Localized Surface Plasmon Microscopy (Slspm)mentioning
confidence: 99%
“…In 2012, B. Zhang et al proposed a confocal system integrated scanning SPM, which provides a simpler and more stable alternative [108]. L. Berguiga et al reported a high-resolution metal-clad waveguide scanning microscopy with a diffraction-limited resolution, which can be operated in both TM and TE waveguide modes with radially and azimuthally polarized beams, respectively, and allows both refractive index and topography of dielectric objects to be evaluated at high resolution and sensitivity [106]. K. Watanabe reported a high resolution imaging with lateral resolution of~170 nm and thickness resolution against the deposited lipid bilayer being~0.33 nm [109].…”
Section: Scanning Localized Surface Plasmon Microscopy (Slspm)mentioning
confidence: 99%