1990
DOI: 10.1016/0168-9002(90)90595-w
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High-resolution simulation of field emission

Abstract: High-resolution simulations of field emission electron sources have been made using the electron optics program EGN2. Electron emission distributions are made using the Fowler-Nordhcim equation. Mesh resolution in the range of 1 5 X is required to adequately model surface details that can result in emission currents in I lie range found experimentally. A typical problem starts with mechanical details with dimensions of

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Cited by 54 publications
(22 citation statements)
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“…This paper presents theory, simulations, and analysis that describe focusing and transport of the electron beam from a field emission tip in the electrostatic field produced by two gate apertures and a focusing anode. The idea of two gates was considered first by W. B. Hermannsfeldt [1] and further investigated by others [2][3]. However, the two-gate concept does not allow sufficiently long focused electron beams.…”
Section: Intrductionmentioning
confidence: 99%
“…This paper presents theory, simulations, and analysis that describe focusing and transport of the electron beam from a field emission tip in the electrostatic field produced by two gate apertures and a focusing anode. The idea of two gates was considered first by W. B. Hermannsfeldt [1] and further investigated by others [2][3]. However, the two-gate concept does not allow sufficiently long focused electron beams.…”
Section: Intrductionmentioning
confidence: 99%
“…We reported on simulations of field emitters at the Toulouse conference on Charged Particle Optics [7]. This capability has found increasing application tõ the new field of microelectronics.…”
Section: Miscellaneous Applicationsmentioning
confidence: 99%
“…We reported on simulations of field emitters at the Toulouse conference on Charged Particle Optics (7). This capability has found increasing application to the new field of microelectronics.…”
Section: Miscellaneous Applicationsmentioning
confidence: 99%