High-Resolution Thermal Profiling of a High-Power Diode Laser Facet During Aging

Wang, Luyang; Jha, Aman Kumar; Baxamusa, Salmaan H.; Kotovsky, Jack; Deri, Robert J.; Swertfeger, Rebecca B.; Thiagarajan, Prabhu; Crowley, Mark T.; Thaler, Gerald; Song, Jiyon; Pipe, Kevin P.

doi:10.1109/jqe.2023.3325256

Cited by 2 publications

(1 citation statement)

References 31 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Modern electronic, optoelectronic, and data storage devices combine nanoscale features, high power densities, and challenging operating environments. Consequently, many devices experience degradation or failure mechanisms that are known to be thermal in nature (1)(2)(3), yet pinpointing the precise causes remains very difficult due to the lack of nanoscale thermometry techniques compatible with realistic operating conditions. Materials characterization challenges such as measuring interfacial thermal resistances across individual grains (4,5) or material phases with nanoscale dimensions would also strongly benefit from broadly compatible nanothermometry approaches.…”

Section: Introductionmentioning

confidence: 99%

Optical super-resolution nanothermometry via stimulated emission depletion imaging of upconverting nanoparticles

Ye,

Harrington,

Pickel

2024

Sci. Adv.

View full text Add to dashboard Cite

From engineering improved device performance to unraveling the breakdown of classical heat transfer laws, far-field optical temperature mapping with nanoscale spatial resolution would benefit diverse areas. However, these attributes are traditionally in opposition because conventional far-field optical temperature mapping techniques are inherently diffraction limited. Optical super-resolution imaging techniques revolutionized biological imaging, but such approaches have yet to be applied to thermometry. Here, we demonstrate a super-resolution nanothermometry technique based on highly doped upconverting nanoparticles (UCNPs) that enable stimulated emission depletion (STED) super-resolution imaging. We identify a ratiometric thermometry signal and maintain imaging resolution better than ~120 nm for the relevant spectral bands. We also form self-assembled UCNP monolayers and multilayers and implement a detection scheme with scan times >0.25 μm 2 /min. We further show that STED nanothermometry reveals a temperature gradient across a joule-heated microstructure that is undetectable with diffraction limited thermometry, indicating the potential of this technique to uncover local temperature variation in wide-ranging practical applications.

show abstract