High spatial resolution studies of surfaces and small particles using electron beam techniques

Venables, J. A.; Liu, J.

doi:10.1016/j.elspec.2004.05.008

Cited by 8 publications

(4 citation statements)

References 91 publications

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“…Quantitative analysis of SE imaging is still in its infancy compared with its counterpart of STEM imaging [15,16]. The spatial resolution of SE imaging in dedicated STEM instruments and the delocalization of SE signals were studied in the past [17][18][19][20][21][22][23][24][25][26].…”

Section: Mechanisms Of Atomic-scale Contrast In Secondary-electron Im...mentioning

confidence: 99%

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Inada

Egerton

et al. 2011

Ultramicroscopy

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We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization.

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Section: Mechanisms Of Atomic-scale Contrast In Secondary-electron Im...mentioning

confidence: 99%

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Inada

Egerton

et al. 2011

Ultramicroscopy

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“…There is scope for many more such studies. High resolution biased Secondary Electron Imaging (b-SEI) is very powerful, as demonstrated using MIDAS; b-SEI can also in principle be done on a new generation of commercial field-emission, lower voltage commercial (user-friendly) SEMs, combined with backscattered electron imaging, as discussed recently by Venables and Liu [43].…”

Section: Discussionmentioning

confidence: 99%

“…Thus Jingyue Liu, supported on a post-doctoral fellowship by Gerard Spinnler of Shell, was able to demonstrate both the resolution and sensitivity of the Auger signal, as well as the applicability of MIDAS to both publishable [41] and proprietary studies of model and real catalysts. Dr Liu went on to a distinguished career with Monsanto, where he is a major expert on catalysts [1]; comparisons of MIDAS and other techniques for such studies have been published more recently [42,43].…”

Section: Applications To Crystal Growth and Catalysismentioning

confidence: 99%

The MIDAS project at ASU: John Cowley's vision and practical results

Venables¹,

Hembree²,

Drucker³

et al. 2005

Microscopy

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An overview of the conception and development of the MIDAS system at Arizona State University is given: a Microscope for Imaging, Diffraction and Analysis of Surfaces. John Cowley's vision in the early 1980s was ambitious and far-reaching, and it was because of him the authors came to ASU. We were centrally involved in the design and implementation of MIDAS from the mid 1980s onwards; the novel design features are briefly reviewed. Practical results obtained using this instrument are listed, and the scope for future development and applications are indicated. While it is clear that many new results have been demonstrated, even more possibilities still remain to be explored. Some comments are made about the feasibility of such developments in the light of competing instrumentation.

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“…However, the important mechanism of Auger signal contrast has not yet been discussed in detail. Furthermore, the interested specimens have been shifted from micrometer structure to nanometer structure (Childs et al, 1996) now with the instrumental improvement (Jacka, 2001;Prutton, 2000;Venables & Liu, 2005); it thus requires explanations for many effects appeared in the nano-systems. In this respect the image simulation can help us to comprehend the contrast formation mechanism and, therefore, is expected to play an important role for predicating the artifact and improving precision of elemental mapping by SAM.…”

Section: Simulation Study Of Scanning Auger Electron Imagesmentioning

confidence: 99%