“…Metal-oxide semiconductors have garnered significant interest as core materials for next-generation displays, primarily owing to their low off-current and suitability for low-temperature processing. In particular, they can be deposited through low-temperature sputtering, a method that enhances process compatibility, leading to improved uniformity across large areas and heightened reliability over extended periods, as evidenced in several studies [ 1 , 2 , 3 , 4 , 5 , 6 ]. Amorphous indium-gallium-zinc oxide (a-IGZO) has been widely used as a channel material for thin-film transistors (TFTs) because of its moderate electron affinity, low threshold voltage, and high transmittance caused by its high-energy band gap [ 7 , 8 , 9 , 10 , 11 , 12 ].…”