2002
DOI: 10.1016/s1076-5670(02)80024-6
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High-speed electron microscopy

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Cited by 43 publications
(16 citation statements)
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“…Such pulses, which were used to study laser-induced melting in metals, pack within them the large number of electrons (∼10 8 ) that are detrimental to achieving ultrashort pulse imaging. Moreover, because the time window for imaging in those experiments is nanoseconds, the uncertainty in spatial resolution due to noise statistics is on the order of micrometers, as pointed out by Bostanjoglo (71). In fact our attempt to use amplified femtosecond light pulses with much higher peak power density (on the order of 10 12 W/cm 2 ) resulted in electron bunches that were impervious to focusing by the microscope optics, and no doubt much broader pulses due to electron-electron repulsion.…”
Section: Ultrafast Electron Microscopymentioning
confidence: 99%
“…Such pulses, which were used to study laser-induced melting in metals, pack within them the large number of electrons (∼10 8 ) that are detrimental to achieving ultrashort pulse imaging. Moreover, because the time window for imaging in those experiments is nanoseconds, the uncertainty in spatial resolution due to noise statistics is on the order of micrometers, as pointed out by Bostanjoglo (71). In fact our attempt to use amplified femtosecond light pulses with much higher peak power density (on the order of 10 12 W/cm 2 ) resulted in electron bunches that were impervious to focusing by the microscope optics, and no doubt much broader pulses due to electron-electron repulsion.…”
Section: Ultrafast Electron Microscopymentioning
confidence: 99%
“…Methods to acquire electron microscopic images with much shorter exposure times than video rates have progressed through several stages since the 1960's [1][2][3], notably from the group of Prof. O. Bostanjoglo at TU Berlin [4]. The methods generally fall into two approaches, stroboscopic and single shot.…”
Section: Introductionmentioning
confidence: 99%
“…In contrast, the single shot imaging method described here, while also following the developments of Bostanjoglo [4,[18][19][20][21][22][23], acquires an electron micrograph with a single pulse of electrons [24]. The requirement of image formation with a single pulse of electrons places stringent conditions on the electron emission and is controlled, as is usual in electron microscopy, by the brightness of the source [25].…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, as noted in [28], the uncertainty in the spatial resolution in these experiments due to statistical interferences was of the order of micrometers, because the temporal window for imaging was on a nanosecond scale. It was found, that the use of amplified femtosecond light pulses, with much higher intensity of about 12 2 10 W cm , led, at first, to the formation of an electron beam that was insensitive to the focusing system of the microscope, and, secondly, to a significant lengthening of the pulse, which was due to electron-electron Coulomb repulsion.…”
Section: Ultrafast Electron Microscopy For Chemistry Biology and Matmentioning
confidence: 74%