2014
DOI: 10.1063/1.4895460
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High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

Abstract: We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM syste… Show more

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Cited by 40 publications
(37 citation statements)
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“…The remaining liquid was immediately absorbed by aspirating to an absorbent filter paper held at the sample edge, and then the sample was dried under a gentle dry nitrogen flow. AFM measurements were made on a Multimode AFM (Bruker, Santa Barbara, CA) using either a custom fast scanning AFM head (Adams et al, ) in tapping mode or in ScanAsyst ™ mode. Fast‐Scan B probes (Bruker) were used for the former and PNP‐TRS probes (Nanoworld, Neuchatel, Switzerland) for the latter.…”
Section: Methodsmentioning
confidence: 99%
“…The remaining liquid was immediately absorbed by aspirating to an absorbent filter paper held at the sample edge, and then the sample was dried under a gentle dry nitrogen flow. AFM measurements were made on a Multimode AFM (Bruker, Santa Barbara, CA) using either a custom fast scanning AFM head (Adams et al, ) in tapping mode or in ScanAsyst ™ mode. Fast‐Scan B probes (Bruker) were used for the former and PNP‐TRS probes (Nanoworld, Neuchatel, Switzerland) for the latter.…”
Section: Methodsmentioning
confidence: 99%
“…Imaging is performed using a home-built high-speed AFM head (see Adams et al (2014)) using a Bruker FastScan-C cantilever. As the controller runs on an FPGA, the computation time increases only linearly with the controller order, and is negligible in the shown example.…”
Section: Resultsmentioning
confidence: 99%
“…To image the sanded mica sample, we used a modified NanoScope V controller and MultiMode 8 AFM system. The modifications to the system were as follows: a custom readout head for small cantilevers 31 , a custom scanner using combined tube and stack piezo actuators with an open-loop −3 dB z bandwidth of 95 kHz and a usable x-y scan range of ∼130 × 130 μm 2 and z scan range of ∼5 μm, and an online, system-identification-based compensation of the lateral scanner resonances 32,33 . We used a small SU-8 cantilever with f 0 = 1.37 MHz.…”
Section: Methodsmentioning
confidence: 99%
“…The amplitude of the drive was modulated with a square wave at a frequency of 20 Hz. To detect the deflection of the small SiN and SU-8 cantilevers, we used a custom-built AFM head 31 . The deflection signal was collected either with the NanoScope controller or with a Picoscope 5242A external oscilloscope at a sampling rate of at least 6 MHz.…”
Section: Methodsmentioning
confidence: 99%