High-speed observation of semiconductor microsphere generation by laser ablation in the air

Tasaki, Ryohei; Higashihata, Mitsuhiro; Suwa, Akira; Ikenoue, Hiroshi; Nakamura, Daisuke

doi:10.1007/s00339-018-1596-3

Cited by 5 publications

(3 citation statements)

References 32 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…One consequence of the size-shape dependence and the resulting CSD bias is that the lateral beam profile deconvolutions could not be reliably checked by comparing the deconvoluted intensity CSD with the SEM-derived volume CSD (see x3.5.2 and xS2.2). Interesting materials that could provide a better reference are, for example, single-crystalline microspheres (Nakamura et al, 2016;Shimogaki et al, 2014;Tasaki et al, 2018;Yang et al, 2008) or idiomorphic single crystals with shapes easily measured with SEM imagery (Pieniążek et al, 2016;Chen et al, 2011).…”

Section: Reference Materialsmentioning

confidence: 99%

A fast X-ray-diffraction-based method for the determination of crystal size distributions (FXD-CSD)

2018

View full text Add to dashboard Cite

A procedure for a fast X-ray-diffraction-based crystal size distribution analysis, named FXD-CSD, is presented. The method enables the user, with minimal sample preparation, to determine the crystal size distribution (CSD) of crystalline powders or polycrystalline materials, derived via an intensity scaling procedure from the diffraction intensities of single Bragg spots measured in spotty diffraction patterns with a two-dimensional detector. The method can be implemented on any single-crystal laboratory diffractometer and any synchrotron-based instrument with a fast-readout two-dimensional detector and a precise sample scanning axis. The intensity scaling is achieved via the measurement of a reference sample with known CSD under identical conditions; the only other prerequisite is that the structure (factors) of both sample and reference material must be known. The data analysis is done with a software package written in Python. A detailed account is given of each step of the procedure, including the measurement strategy and the demands on the spottiness of the diffraction rings, the data reduction and the intensity corrections needed, and the data evaluation and the requirements for the reference material. Using commercial laboratory X-ray equipment, several corundum crystal size fractions with precisely known CSD were measured and analysed to verify the accuracy and precision of the FXD-CSD method; a comparison of known and deduced CSDs shows good agreement both in mean size and in the shape of the size distribution. For the used material and diffractometer setup, the crystal size application range is one to several tens of micrometres; this range is highly material and X-ray source dependent and can easily be extended on synchrotron sources to cover the range from below 0.5 mm to over 100 mm. FXD-CSD has the potential to become a generally applicable method for CSD determination in the field of materials science and pharmaceutics, including development and quality management, as well as in various areas of fundamental research in physics, chemistry, chemical engineering, crystallography, the geological sciences and bio-crystallization. It can be used also under in situ conditions for studying crystal coarsening phenomena, and delivers precise and accurate CSDs, permitting experimental tests of various theories developed to predict their evolution.

show abstract

Section: Reference Materialsmentioning

confidence: 99%

A fast X-ray-diffraction-based method for the determination of crystal size distributions (FXD-CSD)

2018

View full text Add to dashboard Cite

show abstract

“…The main fabrication approaches typically involve the melting of glass materials or the sol-gel process [26]. Other methods to produce crystalline spheres of different sizes (from nano to some millimeters) have been reported and include laser ablation [25,[28][29][30], spray pyrolysis [31,32], microfluidic synthesis strategies [33], hydrolysis-precipitation methods [34], hydrothermal [35], and even other laser sintering approaches [36].…”

Section: Introductionmentioning

confidence: 99%

Red-Emitting Cr3+ on α-Al2O3:Cr Spheres Obtained in Seconds Using Laser Processing

Rodrigues,

Carvalho,

Zanoni

et al. 2024

Applied Sciences

View full text Add to dashboard Cite

Cr-doped Al2O3 spheres with strong red emission were produced using a simple laser processing approach with a 50 W continuous CO2 laser. Structural characterization revealed that the produced spheres were monophasic, comprising the α-Al2O3 phase. Photoluminescence (PL) studies indicated that the observed red emission originates from multiple Cr3+ optical centers being dominated by the 2E → 4A2 transition (R-lines), with a further contribution from the parity and spin forbidden 2T1 → 4A2 transition (R′-lines). The identification of additional radiative recombination from chromium ion pairs (N-lines) evidences that the produced samples are heavily doped. As such, energy transfer processes between the different chromium optical centers are seen to take place, as suggested by the lifetime decay analysis. PL excitation revealed that the room temperature luminescence is preferentially populated via the spin-allowed 4A2 → 4T2,4T1 transitions and by the parity and spin-forbidden 4A2 → 2T2 (B-lines), 2T1 (R′-lines), 2E (R-lines). Such results demonstrate that the present synthesis method is able to deliver high-optical-quality Al2O3:Cr crystals in a fast and simple way, with potential interest for optical, sensing, or lasing applications.

show abstract

“…On-demand patterning of oxide microdots by laser irradiation to a source film has also been reported 10 . In addition, Si microdroplet ejection perpendicular to a bulk Si target surface using an optical vortex beam with a doughnut profile has been reported 11 , 12 , and its mechanism is probably based on laser-driven pressure. Furthermore, in an interesting result, the creation of twisted structures has been reported, corresponding with the total angular momentum of the optical vortex 13 , 14 .…”

Section: Introductionmentioning

confidence: 99%

Silicon twisted cone structure produced by optical vortex pulse with structure evaluation by radiation hydrodynamic simulation

Nakamura

Tasaki

Kawamoto

et al. 2020

Sci Rep

View full text Add to dashboard Cite

We demonstrate a radiation hydrodynamic simulation of optical vortex pulse-ablated microcone structures on silicon (Si) substrates. Doughnut-shaped craters were formed by single pulse irradiation on the Si substrate, and a twisted cone structure with a height of 3.5 µm was created at the center of the irradiation spot by the circularly polarized optical vortex pulse. A two-dimensional (2-D) radiation hydrodynamic simulation reproduced the cone structure well with a height of 3 µm. The central part of the incident laser power was lowered from the initial profile due to plasma shielding over the laser pulse duration for an inverted double-well laser profile. The acute tip shape of the silicon surface can survive over the laser irradiation period.

show abstract

High-speed observation of semiconductor microsphere generation by laser ablation in the air

Cited by 5 publications

References 32 publications

A fast X-ray-diffraction-based method for the determination of crystal size distributions (FXD-CSD)

A fast X-ray-diffraction-based method for the determination of crystal size distributions (FXD-CSD)

Red-Emitting Cr3+ on α-Al2O3:Cr Spheres Obtained in Seconds Using Laser Processing

Silicon twisted cone structure produced by optical vortex pulse with structure evaluation by radiation hydrodynamic simulation

Contact Info

Product

Resources

About