2007
DOI: 10.1016/j.tsf.2006.10.053
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High-speed μc-Si films deposition and large-grain poly-Si films deposition by surface wave discharge

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Cited by 27 publications
(10 citation statements)
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“…These peaks originate from the (111), (220), and (311) crystal planes of silicon, respectively. 14,22 The occurrence of these three diffraction peaks suggests that the Si crystallites can be formed at X ¼ 4.0. With the further increase of X, the intensities of all these diffraction peaks are gradually increased while the full widths at half maximum of all these diffraction peaks become smaller, indicating that the crystallite size becomes larger and the degree of crystallinity has further increased.…”
Section: Resultsmentioning
confidence: 99%
“…These peaks originate from the (111), (220), and (311) crystal planes of silicon, respectively. 14,22 The occurrence of these three diffraction peaks suggests that the Si crystallites can be formed at X ¼ 4.0. With the further increase of X, the intensities of all these diffraction peaks are gradually increased while the full widths at half maximum of all these diffraction peaks become smaller, indicating that the crystallite size becomes larger and the degree of crystallinity has further increased.…”
Section: Resultsmentioning
confidence: 99%
“…One can notice that there exist three major diffraction peaks at 2h = 28.4°, 47.3°, and 56.1°in the XRD patterns when the carbon content X C is less than 10.7at.%. These three diffraction peaks are ascribed to (1 1 1), (2 2 0), and (3 1 1) crystal planes of silicon [18,25]. One can also notice that the intensity of the (1 1 1) diffraction peak is much higher than the intensities of the (2 2 0) and (3 1 1) peaks, suggesting that the deposited films have a preferential growth along the (1 1 1) crystallographic orientation.…”
Section: X-ray Diffractionmentioning
confidence: 87%
“…23,29 In this way, one can eventually obtain high-quality polycrystalline Si under reasonably low temperatures. 34…”
Section: Discussionmentioning
confidence: 99%