1993
DOI: 10.1109/77.233927
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High-T/sub c/ transition-edge bolometer for detecting guided millimeter waves

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Cited by 8 publications
(10 citation statements)
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“…3,4 This includes the onset of the several stages of the transition, the intergrain critical currents, the effect of magnetic fields, the role of inhomogeneities and other kinds of disorder, and the dynamics of the vortex motion in the material. 5 Noise associated with conductivity fluctuations ͑or resistance fluctuations͒ 6,7 has the following characteristic:…”
Section: B Noise In High-t C Superconducting Materialsmentioning
confidence: 99%
“…3,4 This includes the onset of the several stages of the transition, the intergrain critical currents, the effect of magnetic fields, the role of inhomogeneities and other kinds of disorder, and the dynamics of the vortex motion in the material. 5 Noise associated with conductivity fluctuations ͑or resistance fluctuations͒ 6,7 has the following characteristic:…”
Section: B Noise In High-t C Superconducting Materialsmentioning
confidence: 99%
“…1 shows this effect for one of our samples. The shifting ofto lower temperatures has been interpreted to be an intrinsic shift by some groups [1], [5], [8], [12]. At high-bias currents this shift increases the value of the film obtained from the measured versus curve, but this is different from the real versus of the film.…”
Section: B Large-area Patternsmentioning
confidence: 98%
“…This gradient can cause an error in the dc characterizations because in most of the setups the temperature of the cold finger (holder) or the bottom of the substrate is monitored [1]- [12], while the temperature of the film is higher [2], [3]. At high-bias currents this can cause a shift oftoward the lower temperatures in the measured versus curve, as has been observed in many cases [1]- [3], [7], [8], [11]. The shift is related to the temperature gradient across the film-substrate or the substrate-cold-finger interfaces, depending on the film and the substrate dimensions.…”
Section: Introductionmentioning
confidence: 99%
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“…The effect of instability in the temperature of the film caused by high bias currents will appear as an unrealistically sharp transition in the R versus T curve. 2,5,16 The increase of the response that is due to the sharper transition dR͞dT dominates the effect of this decrease in the maximum allowed I b in Eq. ͑3͒, producing an overall increase in the responsivity for films with sharper transitions.…”
Section: Effects Of Substrate Properties and The Bias Current On Rmentioning
confidence: 99%