2018
DOI: 10.1016/j.jpcs.2018.03.006
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High temperature dielectrics and defect characteristic of (Nb, Mn, Zr) modified 0.4(Ba 0.8 Ca 0.2 )TiO 3 – 0.6Bi(Mg 0.5 Ti 0.5 )O 3 ceramics

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Cited by 39 publications
(12 citation statements)
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“…From the measurements of the dielectric constant and dielectric loss as a function of temperature at 1 kHz (Figure a), we can see that the change of the dielectric constant and dielectric loss of the optimum multilayer is only ∼14.59 and 14.01%, respectively, from RT to 250 °C. These temperature-independent dielectric properties can also be found in other modified Bi­(Mg 0.5 Ti 0.5 )­O 3 materials and it can be considered as the lower carrier transport or the re-entrant dipole glass-like relaxor behavior which is caused by the ionic disorder and charge mismatch. The dielectric loss of the multilayer film exhibits a more stable and lower value (less than 0.1) than that of the single layer films of BST and BT–BMZ. These pre-eminent dielectric properties in such a wide temperature range benefit energy storage at high temperature.…”
Section: Resultsmentioning
confidence: 74%
“…From the measurements of the dielectric constant and dielectric loss as a function of temperature at 1 kHz (Figure a), we can see that the change of the dielectric constant and dielectric loss of the optimum multilayer is only ∼14.59 and 14.01%, respectively, from RT to 250 °C. These temperature-independent dielectric properties can also be found in other modified Bi­(Mg 0.5 Ti 0.5 )­O 3 materials and it can be considered as the lower carrier transport or the re-entrant dipole glass-like relaxor behavior which is caused by the ionic disorder and charge mismatch. The dielectric loss of the multilayer film exhibits a more stable and lower value (less than 0.1) than that of the single layer films of BST and BT–BMZ. These pre-eminent dielectric properties in such a wide temperature range benefit energy storage at high temperature.…”
Section: Resultsmentioning
confidence: 74%
“…On the one hand, the permittivity decreases drastically and the high-temperature dielectric anomaly gradually broadened with increasing Ta concentration, indicating that Ta ions promotes the diffuse phase transition behavior of the ceramics. 27,38 On the other hand, the significant increase of dielectric loss at high temperature is attributed to the thermal activation process of oxygen vacancies giving rise to the dc conductivity. 39 The introduction of Ta into to 0.94BNT-0.06BT as a donor creates cation vacancies and possibly gives rise to the decrease of oxygen vacancies according to the defect compensation; Eqs.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, BaTiO 3 (BT)-based ceramics also have been used as capacitors for many years because of the high dielectric constant. [26][27][28][29][30] The introduction of Ba at A site results in suppress the longrange ferroelectric order, which makes the ferroelectric domains become nanometer scale., 31,32 which is conducive to the emergence of large strains for the compositions around morphotropic phase boundary (MPB). In addition, our previous work indicated that rare earth Yb 2 O 3 promotes the grain growth and densification of the ceramics while Ti-rich impurity appears due to the compensation of Ti-vacancy.…”
Section: Introductionmentioning
confidence: 99%
“…where V Li(Cd) and V Li(Ga) represent neutral vacancies, V′ Li and V″ Li represent single and doubly ionized vacancies, respectively, h • is the free electron hole, and V′ O and V″ O are the single and doubly ionized oxygen vacancies, respectively. 42,48,49 To further establish the nature of oxygen vacancies present in Cd 0.40 Ga 0.60 Ga 2.66 O y sample, dielectric loss data (tan δ) recorded in flowing oxygen was plotted against the frequency at various temperatures. Two relaxations, labeled as R1 and R2, could be noted at lowand high-frequency regions (Figure 9a,b).…”
Section: Resultsmentioning
confidence: 99%
“…As the excess gallium in the structure was presumed to be present at tetrahedral interstitial positions, substitution of them with Li + would generate doubly ionized holes. They could be neutralized with the generation of singly and doubly ionized oxygen vacancies, respectively, according to the following mechanism: where V Li(Cd) and V Li(Ga) represent neutral vacancies, V′ Li and V″ Li represent single and doubly ionized vacancies, respectively, h • is the free electron hole, and V′ O and V″ O are the single and doubly ionized oxygen vacancies, respectively. ,, To further establish the nature of oxygen vacancies present in Cd 0.40 Ga 0.60 Ga 2.66 O y sample, dielectric loss data (tan δ) recorded in flowing oxygen was plotted against the frequency at various temperatures. Two relaxations, labeled as R1 and R2, could be noted at low- and high-frequency regions (Figure a,b).…”
Section: Resultsmentioning
confidence: 99%