High temperature oxidation of Ni70Cr30 alloy: Determination of oxidation kinetics and stress evolution in chromia layers by Raman spectroscopy

Kemdehoundja, M.; Dinhut, J.F.; Grosseau-Poussard, Jean-Luc; Jeannin, Marc

doi:10.1016/j.msea.2006.07.083

Cited by 46 publications

(54 citation statements)

References 13 publications

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“…3. Similar large compressive residual stresses have been reported in thermally grown oxide scales as a function of oxidation time and temperature, and relative oxide and substrate thickness [7,10,[33][34][35][36][37]. Residual-stress values ranging from -1.0 to -3.3 GPa were reported for Cr 2 O 3 oxide layers on a NiCr alloy [33], and a range of -1.3 to -2.6 GPa was reported for Cr 2 O 3 oxide layers on a Ni-30Cr alloy [36,37].…”

Section: Resultssupporting

confidence: 76%

“…Oxide residual stress values of -3.6 and -2.9 GPa have also been reported [34,35]. Reported residual stress estimates for Cr 2 O 3 layers formed on Ni-30Cr [34,36,37] and NiCr [33] alloys are -3.5 and -4 to -4.5 GPa, respectively.…”

Section: Resultsmentioning

confidence: 81%

“…Residual-stress values ranging from -1.0 to -3.3 GPa were reported for Cr 2 O 3 oxide layers on a NiCr alloy [33], and a range of -1.3 to -2.6 GPa was reported for Cr 2 O 3 oxide layers on a Ni-30Cr alloy [36,37]. Oxide residual stress values of -3.6 and -2.9 GPa have also been reported [34,35]. Reported residual stress estimates for Cr 2 O 3 layers formed on Ni-30Cr [34,36,37] and NiCr [33] alloys are -3.5 and -4 to -4.5 GPa, respectively.…”

Section: Resultsmentioning

confidence: 93%

“…Growth stresses are residual stresses that occur during the isothermal growth of the oxide scale [29][30][31][32], and are believed to be generated by such phenomena as: epitaxial stresses, point defect stresses, recrystallization stresses, formation of additional oxide within an already established oxide scale, changes in volume or composition in the alloy or oxide scale, and specimen geometry [7,10,12,29,32]. Thermal stresses are residual stresses that arise during cooling due to the coefficient of thermal-expansion mismatch between oxide and alloy [30,[33][34][35]. The growth-stress component of the residual stress values is often considered negligible when compared to the thermal-stress portion [31-33, 36, 37].…”

Section: Resultsmentioning

confidence: 99%

See 3 more Smart Citations

An Evaluation of the Use of X-ray Residual Stress Determination as a Means of Characterizing Oxidation Damage of Nickel-Based, Cr2O3-Forming Superalloys Subjected to Various Oxidizing Conditions

2010

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The use of X-ray residual stress determination as a technique for evaluating the damage incurred by nickel-based, Cr 2 O 3 -forming superalloy materials under various service conditions (isothermal heating, thermal cycling, applied stress, stressed and cycled) was investigated. Large and small compressive residual stresses were observed for the oxides and the near surface substrates, respectively. It was expected that the applied stresses and thermal cycling would cause an enhanced degree of oxidation damage that would translate into appreciable differences in residual stress values. Differences in the magnitude of residual stress values were not appreciable condition-to-condition, however. An increase in the severity of the oxidizing conditions in the form of longer oxidation times, higher oxidizing temperatures, and a much greater frequency of thermal cycling is suggested for future studies.

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Section: Resultssupporting

confidence: 76%

Section: Resultsmentioning

confidence: 81%

Section: Resultsmentioning

confidence: 93%

Section: Resultsmentioning

confidence: 99%

See 2 more Smart Citations

An Evaluation of the Use of X-ray Residual Stress Determination as a Means of Characterizing Oxidation Damage of Nickel-Based, Cr2O3-Forming Superalloys Subjected to Various Oxidizing Conditions

2010

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“…In Table I, a non-exhaustive bibliographical synthesis of several works concerning stress measurements based on those two techniques is given. [7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23] It can be seen that even if the first works starting in 1986 are based on XRD, Raman spectroscopy has become the main technique to measure residual stresses today. However, to our knowledge, these two techniques have not been systematically used together to study residual stresses in the same thermal oxide/ metal system.…”

Section: Introductionmentioning

confidence: 99%

Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

Guérain

Grosseau-Poussard

Géandier

et al. 2017

Journal of Applied Physics

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In oxidizing environments, the protection of metals and alloys against further oxidation at high temperature is provided by the oxide film itself. This protection is efficient only if the formed film adheres well to the metal (substrate), i.e., without microcracks and spalls induced by thermomechanical stresses. In this study, the residual stresses at both macroscopic and microscopic scales in the oxide film adhering to the substrate and over the damaged areas have been rigorously determined on the same samples for both techniques. Ni-30Cr and Fe-47Cr alloys have been oxidized together at 900 and 1000 °C, respectively, to create films with a thickness of a few microns. A multi-scale approach was adopted: macroscopic stress was determined by conventional X-ray diffraction and Raman spectroscopy, while microscopic residual stress mappings were performed over different types of bucklings using Raman micro-spectroscopy and synchrotron micro-diffraction. A very good agreement is found at macro- and microscales between the residual stress values obtained with both techniques, giving confidence on the reliability of the measurements. In addition, relevant structural information at the interface between the metallic substrate and the oxide layer was collected by micro-diffraction, a non-destructive technique that allows mapping through the oxide layer, and both the grain size and the crystallographic orientation of the supporting polycrystalline metal located either under a buckling or not were measured.

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Growth Kinetics and Characterization of Chromia Scales Formed on Ni–30Cr Alloy in Impure Argon at 700 °C

et al. 2020

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The oxidation of a Ni-30Cr alloy at 700 °C in impure argon was studied in order to provide new elements of understanding on chromia scale growth in low oxygen partial pressure atmosphere (10 −5 atm). Oxidation tests were carried out during 30 min to 50 h in a thermogravimetric analysis system using a symmetrical balance with in situ monitoring of the oxygen partial pressure. The oxidation kinetics were determined as parabolic with an estimated stationary parabolic constant value of 10 −15 cm 2 s −1 , after a transient stage of about 3 h. The oxide scale was identified as a pure chromia layer by TEM and XPS characterisations. After 50 h at 700 °C, the scale thickness estimated by TEM cross section observation was about 100 nm. A slightly thicker and more porous oxide scale was observed above the alloy's grain boundaries. The metal/oxide interface also exhibited a deeper recession towards the substrate above the alloy's grain boundaries. The orientation of chromia grains was determined by TKD (transmission Kikuchi diffraction). A strong preference was noted for the orientation perpendicular to the surface, along the < 0001 > direction of the corundum structure. Finally, the type of semiconduction was determined for the scales formed after 7 h and 50 h of oxidation. For the shorter oxidation time, the chromia scale exhibited an n-type semiconduction, whereas for the longer exposure, both n-type and insulating semiconduction were identified.

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High temperature oxidation of Ni70Cr30 alloy: Determination of oxidation kinetics and stress evolution in chromia layers by Raman spectroscopy

Cited by 46 publications

References 13 publications

An Evaluation of the Use of X-ray Residual Stress Determination as a Means of Characterizing Oxidation Damage of Nickel-Based, Cr2O3-Forming Superalloys Subjected to Various Oxidizing Conditions

An Evaluation of the Use of X-ray Residual Stress Determination as a Means of Characterizing Oxidation Damage of Nickel-Based, Cr2O3-Forming Superalloys Subjected to Various Oxidizing Conditions

Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

Growth Kinetics and Characterization of Chromia Scales Formed on Ni–30Cr Alloy in Impure Argon at 700 °C

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