Twenty new alkali
rare earth thiosilicates and thiogermanates with the general formula
ALnTS4 (A = alkali metal, Ln = lanthanide, and T = Si,
Ge) were grown as X-ray diffraction-quality single crystals from molten
alkali chloride fluxes. These include KNdSiS4, KPrSiS4, RbLnSiS4 (Ln = Ce, Pr, Nd, Gd, Tb, Dy, and Ho),
RbLaGeS4, CsLnSiS4 (Ln = La, Pr, and Nd), and
CsLnGeS4 (La, Ce, Pr, Nd, Eu, Gd, and Tb). Herein, we discuss
the use of a molten chloride flux growth approach for the preparation
of the title compounds and their structure determination via single-crystal
X-ray diffraction. In addition, we comment on the magnetic properties
of RbNdSiS4, CsNdSiS4, CsNdGeS4,
and CsGdGeS4, which were found to be paramagnetic for T = 2–300 K and exhibited negative Weiss temperatures
with no obvious antiferromagnetic transition down to 2 K. The optical
properties of CsLaGeS4 and CsNdTS4(T = Si, Ge)
were measured by UV–vis spectroscopy. Second harmonic generation
measurements performed on CsLaGeS4 confirmed the crystallization
of the compound in the noncentrosymmetric orthorhombic space group, P212121; CsLaGeS4 was found to be SHG-active with nearly half the intensity of α-SiO2 upon irradiation with a Nd:YAG 1064 nm laser, and a semiconductor
exhibiting a band gap of 3.60 eV based on UV–vis diffuse reflectance
measurements.