2014
DOI: 10.1116/1.4901883
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High-voltage energy dispersive x-ray spectrometry using a low-energy primary beam

Abstract: This paper proposes a way to do energy dispersive x-ray spectroscopy (EDS) at high accelerating voltages using a low-voltage field emission scanning electron microscope (FESEM). By biasing the sample to a positive voltage, the electron landing energy (also known as the x-ray excitation energy) is increased, effectively extending the EDS capabilities of the low-voltage SEM. This positive biasing reduces the signal-to-noise ratio of the FESEM image, but it also introduces scaling and offset errors. A one-time ca… Show more

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Cited by 3 publications
(1 citation statement)
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“…Excitation energies >10keV are necessary to obtain the unique the x-ray signature of most materials, yet miniature columns currently cannot operate above a few keV. This problem is overcome by biasing the sample to > +13keV, which creates post-lens acceleration and 15keV -20keV landing energies [5]. The result is good EDS performance (with a few limitations described elsewhere), and interesting new physics in the x-ray generation process.…”
mentioning
confidence: 99%
“…Excitation energies >10keV are necessary to obtain the unique the x-ray signature of most materials, yet miniature columns currently cannot operate above a few keV. This problem is overcome by biasing the sample to > +13keV, which creates post-lens acceleration and 15keV -20keV landing energies [5]. The result is good EDS performance (with a few limitations described elsewhere), and interesting new physics in the x-ray generation process.…”
mentioning
confidence: 99%