Scanning electron microscopes (SEMs) have been the workhorse of high-technology research and development for well over 50 years with applications ranging from the life sciences to forensic sciences. Improvements in SEM performance, operating conditions, ability to accommodate analytical instrumentation, portability, user interface, software, and automation, have progressed at a rapid rate bringing SEM into main stream usage. Today, innovations such as low-voltage imaging and compound or cathode lenses allow researchers to routinely image and analyze nanoscale structures at <2nm resolution [1]. However, the fundamental architecture of SEMs-a high-brightness macro-scale electron source coupled with precision-machined magnetic and electrostatic lens, deflection and correction elements-has also imposed, with few exceptions, the requirement that the sample be brought to the system rather than the system to the sample. Removing this constraint could create new types of field applications which would benefit from the SEM's high resolution imaging and analytical capabilities. An example from space exploration is shown in Fig 1, where undetected fine-grained lunar dust can create potentially life threatening situations [2]. Miniature electron beam columns, shown in Fig 2, are a relatively new class of electrostatic columns fabricated from silicon using standard microfabrication processes. The defining characteristics of these columns are a thermal field emission (TFE) source, low voltage operation (typically < 3keV), simple design (two lenses, no crossover), aperture lenses, ceramic carriers and impedance-controlled patterned interconnects. Production versions of miniature columns achieve <10 nm resolution at 1keV, and have demonstrated <6nm resolution at higher beam energies [3]. Currently, they are available only in a desktop SEM, but, with the small size, low power and high performance, miniature columns are ideal candidates for field applications.