High-voltage pulse stressing of thick-film resistors and noise

Stanimirovic, I.; Jevtic, M.M.; Stanimirovic, Z.

doi:10.1016/s0026-2714(03)00094-5

Cited by 14 publications

(21 citation statements)

References 7 publications

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“…Moreover, several papers explored properties of thick-film surge resistors [11] that serve as protection of communication systems from a variety of voltage disturbances such as short duration, high-voltage transients caused by lightning strikes or longer duration over voltages. Nowadays, the revival of thick-film technology that can be attributed to new applications of thick-film resistors induced the necessity of extensive behavioural studies related to undesirable high-voltage pulse stressing of conventional thick resistive films [12][13][14].…”

Section: Failure Analysis Of Thick-film Resistors Subjected To High-vmentioning

confidence: 99%

“…. Experimental results for voltage and resistance noise spectra (◆-before pulse stressing, ■-after pulse stressing), for thick-film resistors with following nominal resistances: R ¼ 16 kΩ (a, b) and R ¼ 220 kΩ (c) [12].…”

Section: Failure Analysis Of Thick-film Resistors Subjected To High-vmentioning

confidence: 99%

“…For these reasons, change in the resistance noise Figure 5. SEM micrographs of 10 kΩ/sq (a) and 100 kΩ/sq (b) thick-film resistors fired for 10 min at 850 C [12].…”

Section: Failure Analysis and Preventionmentioning

confidence: 99%

“…High-voltage treatment caused numerous catastrophic failures in tested resistors [12]. Figure 6 shows failed 100 kΩ/sq thick-film resistor that was exposed to eleven 1500 V pulses and a single 3000 V pulse.…”

Section: Failure Analysis and Prevention 72mentioning

confidence: 99%

“…The ratio between the glass and Figure 6. Photograph of 100 kΩ/sq thick-film resistor that catastrophically failed (a) and micrograph of the damaged area (b) [12].…”

Section: Failure Analysis and Prevention 72mentioning

confidence: 99%

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Thick‐Film Resistor Failure Analysis Based on Low‐Frequency Noise Measurements

Stanimirovic¹

2017

Failure Analysis and Prevention

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The chapter aims to present research results in the field of thick-film resistor failure analysis based on standard resistance and low-frequency noise measurements. Noise spectroscopy-based analysis establishes correlation between noise parameters and parameters of noise sources in these heterogeneous nanostructures. Validity of the presented model is verified experimentally for resistors operating under extreme working conditions. For the experimental purposes, thick-film resistors of different sheet resistances and geometries, realized using commercially available thick-film resistor compositions, were subjected to high-voltage pulse (HVP) stressing. The obtained experimental results are qualitatively analysed from microstructure, charge transport mechanism and low-frequency noise aspects. Correlation between resistance and lowfrequency noise changes with resistor degradation and failure due to high-voltage pulse stressing is observed.

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Section: Failure Analysis Of Thick-film Resistors Subjected To High-vmentioning

confidence: 99%

Section: Failure Analysis Of Thick-film Resistors Subjected To High-vmentioning

confidence: 99%

“…For these reasons, change in the resistance noise Figure 5. SEM micrographs of 10 kΩ/sq (a) and 100 kΩ/sq (b) thick-film resistors fired for 10 min at 850 C [12].…”

Section: Failure Analysis and Preventionmentioning

confidence: 99%

Section: Failure Analysis and Prevention 72mentioning

confidence: 99%

“…The ratio between the glass and Figure 6. Photograph of 100 kΩ/sq thick-film resistor that catastrophically failed (a) and micrograph of the damaged area (b) [12].…”

Section: Failure Analysis and Prevention 72mentioning

confidence: 99%

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