2010
DOI: 10.1063/1.3463232
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Higher Order Suppressor (HOS) for the PolLux Microspectroscope Beamline at the Swiss Light Source SLS

Abstract: The mechanical design and performance of a device to suppress higher orders of a spherical grating monochromator at a constant deviation angle is described. The higher order suppressor (HOS) is used for a scanning transmission x-ray microspectroscope beamline (PolLux) at a bending magnet of the Swiss Light Source (SLS). The instruments allow microspectroscopy in polymer science, of biological samples in the water window as well as the study of magnetic materials with circular or linear polarized light in a pho… Show more

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Cited by 36 publications
(29 citation statements)
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“…NEXAFS investigations were performed ex situ at the PolLux beamline (X07DA) of the synchrotron radiation facility SLS at the PSI, using STXM with an energy resolution of E/DE 4 3000 for the 270-350 eV energy range. 44,[60][61][62] The NEXAFS measurements were performed under normal incidence in the ''line-scan'' mode in each region of interest with a length of 25 mm. On each position, the transmitted photon flux I was measured in an energy scan with varying energy step sizes for different regions of the spectrum (270-282 eV, 0.5 eV step; 282.1-293.0 eV, 0.2 eV step; 293.25-300.00 eV, 0.25 eV step; 301-350 eV, 1 eV step; dwell time 100 ms) was recorded.…”
Section: Discussionmentioning
confidence: 99%
“…NEXAFS investigations were performed ex situ at the PolLux beamline (X07DA) of the synchrotron radiation facility SLS at the PSI, using STXM with an energy resolution of E/DE 4 3000 for the 270-350 eV energy range. 44,[60][61][62] The NEXAFS measurements were performed under normal incidence in the ''line-scan'' mode in each region of interest with a length of 25 mm. On each position, the transmitted photon flux I was measured in an energy scan with varying energy step sizes for different regions of the spectrum (270-282 eV, 0.5 eV step; 282.1-293.0 eV, 0.2 eV step; 293.25-300.00 eV, 0.25 eV step; 301-350 eV, 1 eV step; dwell time 100 ms) was recorded.…”
Section: Discussionmentioning
confidence: 99%
“…STXM/NEXAFS measurements were performed at the PolLux endstation located at the Swiss Light Source (SLS) to obtain the Fe oxidation state of particles between 0.2-2 µm in diameter (Flechsig et al, 2007;Frommherz et al, 2010;Raabe et al, 2008).…”
Section: Chemical Characterization By Stxm/nexafsmentioning
confidence: 99%
“…Similar systems have been described elsewhere (e.g. Waki et al, 1989;Frommherz et al, 2010;Bulicke et al, 1997).…”
Section: Introductionmentioning
confidence: 87%