Highly-charged-ion-induced electron emission from C<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mrow /><mml:mn>60</mml:mn></mml:msub></mml:math>thin films

Bodewits, E.; Hoekstra, Ronnie; Kowarik, G.; Dobes, K.; Aumayr, F.

doi:10.1103/physreva.84.042901

Cited by 9 publications

(14 citation statements)

References 33 publications

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“…However, it is well supported by classical-over-barrier calculations [17]. Experimental studies of electron emission during HCI neutralization at surfaces are commonly restricted to metallic surfaces [37][38][39][40]. For the surface of insulators only rare data is available for low to moderate charge states or at moderate projectile velocities [41,42] (see also [43] and reference therein).…”

Section: Secondary Electron Emissionmentioning

confidence: 99%

Highly charged ion induced nanostructures at surfaces by strong electronic excitations

Wilhelm¹,

El-Said²,

Heller³

et al. 2015

Progress in Surface Science

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a b s t r a c tNanostructure formation by single slow highly charged ion impacts can be associated with high density of electronic excitations at the impact points of the ions. Experimental results show that depending on the target material these electronic excitations may lead to very large desorption yields in the order of a few 1000 atoms per ion or the formation of nanohillocks at the impact site. Even in ultra-thin insulating membranes the formation of nanometer sized pores is observed after ion impact. In this paper, we show recent results on nanostructure formation by highly charged ions and compare them to structures and defects observed after intense electron and light ion irradiation of ionic crystals and graphene. Additional data on energy loss, charge exchange and secondary electron emission of highly charged ions clearly show that the ion charge dominates the defect formation at the surface.

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Section: Secondary Electron Emissionmentioning

confidence: 99%

Highly charged ion induced nanostructures at surfaces by strong electronic excitations

Wilhelm¹,

El-Said²,

Heller³

et al. 2015

Progress in Surface Science

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“…1). A voltage of À100 V on the suppressor shield inhibits stray electrons entering the collector cone and secondary electrons, which may be produced by energetic or multi-charged ions, 32 leaving it. To further reduce the chance of stray electrons arriving at the collector, a bias voltage of À30 V is applied to the collector cone itself.…”

Section: Methodsmentioning

confidence: 99%

Ion distribution and ablation depth measurements of a fs-ps laser-irradiated solid tin target

Deuzeman

Stodolna

Leerssen

et al. 2017

Journal of Applied Physics

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Ion distribution and ablation depth measurements of a fs-ps laser-irradiated solid tin target Deuzeman, M. J.; Stodolna, A. S.; Leerssen, E. E. B.; Antoncecchi, A.; Spook, N.; Kleijntjens, T.; Versluis, J.; Witte, S.; Eikema, K. S. E.; Ubachs, W. Link to publication in University of Groningen/UMCG research database Citation for published version (APA): Deuzeman, M. J., Stodolna, A. S., Leerssen, E. E. B., Antoncecchi, A., Spook, N., Kleijntjens, T., ... Versolato, O. O. (2017). Ion distribution and ablation depth measurements of a fs-ps laser-irradiated solid tin target. Journal of Applied Physics, 121(10), [103301]. https://doi.org/10.1063/1.4977854 Copyright Other than for strictly personal use, it is not permitted to download or to forward/distribute the text or part of it without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license (like Creative Commons).Take-down policy If you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim. Ion distribution and ablation depth measurements of a fs-ps laser-irradiated solid tin target The ablation of solid tin surfaces by a 800-nanometer-wavelength laser is studied for a pulse length range from 500 fs to 4.5 ps and a fluence range spanning from 0.9 to 22 J/cm 2 . The ablation depth and volume are obtained employing a high-numerical-aperture optical microscope, while the ion yield and energy distributions are obtained from a set of Faraday cups set up under various angles. We found a slight increase of the ion yield for an increasing pulse length, while the ablation depth is slightly decreasing. The ablation volume remained constant as a function of pulse length. The ablation depth follows a two-region logarithmic dependence on the fluence, in agreement with the available literature and theory. In the examined fluence range, the ion yield angular distribution is sharply peaked along the target normal at low fluences but rapidly broadens with increasing fluence. The total ionization fraction increases monotonically with fluence to a 5%-6% maximum, which is substantially lower than the typical ionization fractions obtained with nanosecond-pulse ablation. The angular distribution of the ions does not depend on the laser pulse length within the measurement uncertainty. These results are of particular interest for the possible utilization of fs-ps laser systems in plasma sources of extreme ultraviolet light for nanolithography. Published by AIP Publishing. [http://dx

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“…For low incidence angles this is most obvious. As proposed in a previous paper [10], the relative yield is represented by an exponential gain curve, given by the equation…”

Section: Resultsmentioning

confidence: 99%

“…The experimental setup IISIS is described in more detail in Refs. [10] and [14]. The base pressure in the main chamber is in the 10 −11 mbar regime and kept there by means of a 400 L/s ion pump.…”

Section: Methodsmentioning

confidence: 99%

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Kinetic-energy-driven enhancement of secondary-electron yields of highly charged ions impinging on thin films of C60on Au

Bodewits¹,

Hoekstra²,

Dobes

et al. 2012

Phys. Rev. A

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The secondary electron yields as a result of slow highly charged ions (Ar 4+ ,Ar 13+ ) impinging on clean Au(111), highly oriented pyrolitic graphite, and thin films of C 60 on Au are presented. In order to investigate the dynamics of the neutralization of the highly charged ions in front of the surface, angular scans have been performed. The results give a clear indication that the observed increase in electron yield seen on C 60 compared to Au stems from kinetic-energy-driven processes and not from processes driven by the potential energy carried by the highly charged ion.

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Highly-charged-ion-induced electron emission from C60thin films

Cited by 9 publications

References 33 publications

Highly charged ion induced nanostructures at surfaces by strong electronic excitations

Highly charged ion induced nanostructures at surfaces by strong electronic excitations

Ion distribution and ablation depth measurements of a fs-ps laser-irradiated solid tin target

Kinetic-energy-driven enhancement of secondary-electron yields of highly charged ions impinging on thin films of C60on Au

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