2008
DOI: 10.1007/s10832-008-9475-5
|View full text |Cite
|
Sign up to set email alerts
|

Highly enhanced electrochemical performance of silicon-free platinum–yttria stabilized zirconia interfaces

Abstract: In the drive to achieve economically viable solid oxide fuel cells, efforts have been directed towards substantially decreasing their operating temperature. Unfortunately, these efforts have been hindered by extremely sluggish electrode kinetics at reduced temperatures. In this report, we show that silicon impurities on the surface of the electrolyte play a critical role in influencing electrode kinetics. More specifically, improvements by as much as three orders of magnitude are reported for the performance o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

4
57
0
1

Year Published

2009
2009
2022
2022

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 52 publications
(62 citation statements)
references
References 42 publications
(60 reference statements)
4
57
0
1
Order By: Relevance
“…Silicate impurities segregate to the surface during high temperature sintering [29,30] and are known to inhibit the electrochemical properties of the platinum electrode by blocking the oxygen reaction [31]. If the impurities are deposited at the TPB, as shown in Fig.…”
Section: Discussionmentioning
confidence: 99%
“…Silicate impurities segregate to the surface during high temperature sintering [29,30] and are known to inhibit the electrochemical properties of the platinum electrode by blocking the oxygen reaction [31]. If the impurities are deposited at the TPB, as shown in Fig.…”
Section: Discussionmentioning
confidence: 99%
“…This is especially crucial since the oxygen surface exchange that occurs on cathode surfaces is responsible for the majority of voltage loss in SOFCs and avoiding Si or other impurities is critical [22]. Therefore, when developing LSCF-YSZ membranes for Si-based lSOFCs, we deposited 75 nm YSZ first then 63 nm LSCF on Si 3 N 4 -coated Si substrates.…”
Section: Annealing Temperature Dependence Of Microstructure In Lscf/ymentioning
confidence: 99%
“…(ii) Since LSCF-YSZ membranes are released from Si 3 N 4 prior to any HT treatment, they are thus not subject to the high thermal stresses caused by Si 3 N 4 and are likely to have more room in temperaturestress design space to resist buckling failure, albeit thinner films are more susceptible to tensile failure. (iii) Moreover, the likelihood of forming an interfacial layer between YSZ and Si 3 N 4 and poisoning by Si [22] are greatly minimised.…”
Section: Microfabrication Of Cea Membranesmentioning
confidence: 99%
See 2 more Smart Citations