2015
DOI: 10.1038/am.2014.126
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Highly flexible and robust N-doped SiC nanoneedle field emitters

Abstract: Flexible field emission (FE) emitters, whose unique advantages are lightweight and conformable, promise to enable a wide range of technologies, such as roll-up flexible FE displays, e-papers and flexible light-emitting diodes. In this work, we demonstrate for the first time highly flexible SiC field emitters with low turn-on fields and excellent emission stabilities. n-Type SiC nanoneedles with ultra-sharp tips and tailored N-doping levels were synthesized via a catalyst-assisted pyrolysis process on carbon fa… Show more

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Cited by 65 publications
(41 citation statements)
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“…The stable property of our SiC nanowire emitters fabricated by screen-printing is compatible with the SiC cathode by directly grown as well as other nanostructured cathodes previously reported. For example, it is found that the current fluctuations is 7.1% for the SiC convex geometries during the testing period of 1 hour, 37 14.1% for the n-type SiC nanoneedles under 200 • C during the testing period of 60 minutes, 38 and 18% for reduced graphene oxide (RGO) emitters during the testing period of 1 hour. 40 Stable devices are associated with excellent field emission performance.…”
Section: Resultsmentioning
confidence: 99%
“…The stable property of our SiC nanowire emitters fabricated by screen-printing is compatible with the SiC cathode by directly grown as well as other nanostructured cathodes previously reported. For example, it is found that the current fluctuations is 7.1% for the SiC convex geometries during the testing period of 1 hour, 37 14.1% for the n-type SiC nanoneedles under 200 • C during the testing period of 60 minutes, 38 and 18% for reduced graphene oxide (RGO) emitters during the testing period of 1 hour. 40 Stable devices are associated with excellent field emission performance.…”
Section: Resultsmentioning
confidence: 99%
“…In such unique configuration, the direction of the emitted electrons is always perpendicular to the anode surface (as presented in Figure C), which facilitates limiting the screening effect; (c) The tapered morphology of the attained SiC nanowire. The FE characteristics of the emitters could be effectively improved through controlling the growth of emitters that have both clear and sharp tips, for the improved local field enhancement effect; (d) The bamboo‐like body of the SiC nanowires, of which the sharp corners around the nanowire body are likely to play the role of effective electron emitting sites, as illustrated in Figure D.…”
Section: Resultsmentioning
confidence: 99%
“…There has been an extensive study of the field emission (FE) from nanostructured emitters in previous decades, for their potential use in the flat‐panel displays, high‐resolution electron‐beam instruments, electron microscopes, X‐ray tubes, etc . Among the field emitter communities, silicon carbide (SiC) has been proved as one of the pivotal and outstanding FE cathode candidates, for its low thermal‐shock resistance and thermal‐expansion coefficient, high electron mobility and low electron affinity, etc . In addition, SiC has excellent mechanical properties, high chemical stability, and thermal conductivity, which make it an ideal candidates for surviving harsh working conditions, for instance at high powers, high temperatures as well as high voltages .…”
Section: Introductionmentioning
confidence: 91%
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“…The as‐synthesized SiCNPs field emitters possess much lower aspect ratio as compared to those of the 1D nanostructures often with a aspect ratio higher than 50. The current emission fluctuations are ≈±3.0%, ± 2.6%, ±2.5%, ±2.1%, and ±2.8%, as for the SiCNPs field emitters configured in flat state, convex bending with the radios of ≈1.2 and ≈0.4 cm, concave bending with the radios of ≈1.2 and ≈0.4 cm, which suggest the significant enhanced current emission stabilities as compared to those of ≈8.9%, 8.1%, and 7.1% responding to the concave, flat and convex states of the N‐doping SiC nanoneedles, respectively . It indicates that the stresses of the substrate caused by bending do not have significant effect on the current emission stabilities.…”
mentioning
confidence: 78%