sensors, high contrast of polarized light detection, and imaging. [1][2][3] As a key figure of merit, polarization sensitivity, defined as the ratio of maximum to minimum photocurrent in a photodetector upon polarized light illumination with varying polarization angles, can eventually determine the resolution and contrast of optical identification and imaging targets. [4] Conventional polarized light detectors utilizing optical filters suffer from complex fabrication and calibration processes, which increases the complexity and cost. [5] Devices based on 1D materials, including InP, [6] GaN, [7] Bi 1.85 ln 0.15 S 3 , [8] and Bi 2 Se 2 S [9] nanowires, have the capability of polarized light detection due to the anisotropic geometric effect. But most of them have poor polarization sensitivity and require complex preparation processes such as molecular beam epitaxy. In addition, it is rather difficult to integrate these nanochannels with substrates, such as silicon, because of their lattice mismatch, which limits the diversity and application of polarization-resolved devices. [10] Compared to 1D nanostructures, layered low-symmetric 2D materials with an in-plane anisotropic crystalline structure, such as BP, [11] Te, [12] SnS, [13] GeAs, [14] and ReS 2 , [15] are more suitable for the fabrication of polarized photodetectors due to their tunable bandgap, atomically thin profile, and transparency. [16]