2010
DOI: 10.1016/j.tsf.2009.07.207
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Highly sensitive ultraviolet detector using a ZnO/Si layered SAW oscillator

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Cited by 68 publications
(42 citation statements)
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“…The surface of all the ZnO films is very smooth, and the RMS roughness of the films is less than 11 nm, comparable to those obtained from the films deposited on solid substrates. 28,29 Xu et al 30 pointed that when the film is thin, the growth mode of the ZnO grains is dominated by a vertical growth mode, and the RMS roughness increases with increase in thickness; when the thickness reaches a critical point, the growth mode changes from a vertical growth mode to a lateral mode. The lateral growth makes the ZnO film much denser with large grain sizes.…”
Section: A Influence Of Zno Deposition Parameters On Crystal Structurementioning
confidence: 99%
“…The surface of all the ZnO films is very smooth, and the RMS roughness of the films is less than 11 nm, comparable to those obtained from the films deposited on solid substrates. 28,29 Xu et al 30 pointed that when the film is thin, the growth mode of the ZnO grains is dominated by a vertical growth mode, and the RMS roughness increases with increase in thickness; when the thickness reaches a critical point, the growth mode changes from a vertical growth mode to a lateral mode. The lateral growth makes the ZnO film much denser with large grain sizes.…”
Section: A Influence Of Zno Deposition Parameters On Crystal Structurementioning
confidence: 99%
“…There are also other substrates for fabricating ZnO based thin film high frequency SAW devices, such as diamond, diamond-like carbon films, SiC [74][75][76][77]. Other substrates suitable for the deposition of TM-doped ZnO films are Si [78,79], AlN/Si [80,81], SiO 2 /Si [82][83][84], and LiNbO 3 [85].…”
Section: Film Growth Of Tm-doped Znomentioning
confidence: 99%
“…ZnO can be used for preparing transparent conducting contacts for solar cells, surface acoustic wave (SAW) devices and sensors [1,2]. Moreover, ZnO has increased interest in its various applications for short wavelength optoelectronics, transparent electronic materials [3][4][5] and tip materials of scanning probe microscopy.…”
Section: Introductionmentioning
confidence: 99%