2023
DOI: 10.1016/j.matchemphys.2023.127669
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Ho and Nd ion beam modifications of ZnO thin films

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Cited by 3 publications
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“…However, certain ZnO lms show tensile lattice stress along the c axis, according to some reports. 22,23 The asymmetry of the diffraction line indicates that the structural aws at the substrate and A3ZO interface are the cause of the stress.…”
Section: Structural Analysismentioning
confidence: 99%
“…However, certain ZnO lms show tensile lattice stress along the c axis, according to some reports. 22,23 The asymmetry of the diffraction line indicates that the structural aws at the substrate and A3ZO interface are the cause of the stress.…”
Section: Structural Analysismentioning
confidence: 99%