2007
DOI: 10.1016/j.jcrysgro.2006.10.039
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Homoepitaxial growth rate measurement using in situ reflectance anisotropy spectroscopy

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Cited by 6 publications
(1 citation statement)
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“…The prediction error is in an acceptable range, which implies that the developed model was flexible enough to provide desirable prediction accuracy for both (100) and (010) substrates considering the system fluctuation of the MOVPE system. The possible prediction deviation of the doping level may be due to the lack of reliable in situ growth-rate-measurement techniques, as is widely utilized for the homoepitaxial growth of III-V group semiconductor materials [47], and the unknown incoming precursor molar flow on the substrate surface. It puts doubts on the precision of the collected growth parameters and the quality of data.…”
Section: Resultsmentioning
confidence: 99%
“…The prediction error is in an acceptable range, which implies that the developed model was flexible enough to provide desirable prediction accuracy for both (100) and (010) substrates considering the system fluctuation of the MOVPE system. The possible prediction deviation of the doping level may be due to the lack of reliable in situ growth-rate-measurement techniques, as is widely utilized for the homoepitaxial growth of III-V group semiconductor materials [47], and the unknown incoming precursor molar flow on the substrate surface. It puts doubts on the precision of the collected growth parameters and the quality of data.…”
Section: Resultsmentioning
confidence: 99%