2015
DOI: 10.1149/2.0031510jes
|View full text |Cite
|
Sign up to set email alerts
|

Honey-Comb Structured WO3/TiO2Thin Films with Improved Electrochromic Properties

Abstract: The electrochromic properties of 90:10 WO 3 /TiO 2 thin films produced by anodizing co-sputtered W/Ti films in a fluorinated ethylene glycol solution are investigated in relation to corresponding pure WO 3 films. SEM images revealed that the TiO 2 content resulted in a more open honey-comb structure that increased the charge accommodation ability by 250%. The superior charge storage property of the WO 3 /TiO 2 meant that it had a better light modulation range, with transmittance of <1% at 800 nm in the colored… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
10
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 24 publications
(11 citation statements)
references
References 51 publications
1
10
0
Order By: Relevance
“…Tungsten oxide (WO 3 ) is the most widely studied EC material. Currently, industrial-scale mass production of EC glass mainly relies on the sputter-deposited WO 3 film on indium tin oxide (ITO) transparent conductive (TC) glass. The continuous increasing of ITO price motivates people to exploit new TC materials such as aluminum-doped ZnO, silver nanowire films, graphene, and dielectric–metal–dielectric (DMD) trilayer films, etc., which may be potentially substituted for ITO.…”
Section: Introductionmentioning
confidence: 99%
“…Tungsten oxide (WO 3 ) is the most widely studied EC material. Currently, industrial-scale mass production of EC glass mainly relies on the sputter-deposited WO 3 film on indium tin oxide (ITO) transparent conductive (TC) glass. The continuous increasing of ITO price motivates people to exploit new TC materials such as aluminum-doped ZnO, silver nanowire films, graphene, and dielectric–metal–dielectric (DMD) trilayer films, etc., which may be potentially substituted for ITO.…”
Section: Introductionmentioning
confidence: 99%
“…To follow the variation in the Ni oxidation state in real time, we perform FEXRAV, consisting of measuring the X-ray absorption coefficient (μ) at a fixed energy while scanning the potential (Figure d). The FEXRAV curves are recorded at 8350 eV, giving the maximum contrast between the different Ni oxidation states.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, our acronyms R interface and C interface correspond to the literature-reported C trap and R ct,trap that represent the capacitance of surface states and resistance to charge transfer from surface states, respectively. In the case of α-Fe 2 O 3 /NiO x -H, the EC is implemented with an additional Warburg element ( Z W ) because if compared with bare α-Fe 2 O 3 and α-Fe 2 O 3 /NiO x -L electrodes in the Bode/phase plot (Figure S13) it shows a non-negligible contribution of mass transport (diffusion), producing a straight line with a slope of 45° at low frequencies. The values of all parameters retrieved from EIS measurements are reported in Table .…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, the platform extended farthest to 60 • describes a diffusion process, which is characterized by the size of warburg. The size of warburg time constant is inversely proportional to the square-root of Zn 2+ diffusivity (Gui and Blackwood, 2015). The fitting results based on the equivalent circuit displayed in Figure 2C were listed in Table 1, where R s represents the series resistance originated from electrode, electrolyte, and the contact; CPE DL denotes a constant phase element designating the double layer capacitance arising from the charges accumulated on the surface of electrode; R CT is the resistance produced by the charge transfer process from the electrolyte to Zn surface, which also associates with this process kinetics; and Wo is symbolized as an open circuit Warburg impedance reflecting ion diffusion from electrolyte to the electrode/electrolyte interface.…”
Section: Resultsmentioning
confidence: 99%