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Resistivity, (T), of as-grown and annealed Cu 2 ZnSnS 4 films, obtained by flash evaporation, isinvestigated between T ~ 10 300 K. A correlation between the transport properties and the growth conditions of the thin films is also explored. The behavior of (T) in the as-grown films exhibits a close proximity to the metal-insulator transition (MIT), whereas annealing shifts the material from the MIT towards an insulating side. This is attributable to an increased microscopic lattice disorder, which is substantiated by the analysis of the Mott variable-range hopping conductivity observed up to T ~ 220 280 K (120 180 K) in the as-grown (annealed) films. An increased width of the acceptor band, a decreased relative acceptor concentration, N/N c and lower values of the mean density of the localized states, g, are obtained after annealing.