1973
DOI: 10.1103/physrevlett.31.44
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Hopping Conductivity in Granular Metals

Abstract: The data points in Fig. 2

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Cited by 904 publications
(498 citation statements)
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“…In conventional ES VRH, Coulomb interaction effects lead to a soft-gapped density of states around E F giving r ¼ r ES exp (T ES /T) 1/2 , where T ES ¼ 2.8 e 2 /kk B L C , and k is the dielectric constant 29 . A similar T dependence can, however, also be obtained from thermally assisted tunnelling between nanoscopic conductive regions in a more insulating matrix, due to the Coulomb penalty associated with single carrier charging 30 . Such models have been adapted to semiconducting polymers 8 and claims of observation of this mechanism have been made 9 .…”
Section: Electrochemical Thin Film Transistorsmentioning
confidence: 82%
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“…In conventional ES VRH, Coulomb interaction effects lead to a soft-gapped density of states around E F giving r ¼ r ES exp (T ES /T) 1/2 , where T ES ¼ 2.8 e 2 /kk B L C , and k is the dielectric constant 29 . A similar T dependence can, however, also be obtained from thermally assisted tunnelling between nanoscopic conductive regions in a more insulating matrix, due to the Coulomb penalty associated with single carrier charging 30 . Such models have been adapted to semiconducting polymers 8 and claims of observation of this mechanism have been made 9 .…”
Section: Electrochemical Thin Film Transistorsmentioning
confidence: 82%
“…28). The T À 1/2 behaviour, however, could be interpreted in a number of ways, particularly conventional Efros-Shklovskii (ES) VRH 29 or inter-cluster hopping 30 . In conventional ES VRH, Coulomb interaction effects lead to a soft-gapped density of states around E F giving r ¼ r ES exp (T ES /T) 1/2 , where T ES ¼ 2.8 e 2 /kk B L C , and k is the dielectric constant 29 .…”
Section: Electrochemical Thin Film Transistorsmentioning
confidence: 99%
“…9͒, showing the expected behavior for thermally assisted tunneling in the dielectric regime. 4,5,7,11,12 In contrast, C p is almost temperature inde- …”
Section: Random R-c Networkmentioning
confidence: 99%
“…The dc conductance was extrapolated from measurements at 12 Hz. The temperature dependence of the dc resistivity ͑T͒ in the dielectric regime can be satisfactorily described by thermally assisted tunneling and Coulomb blockade for all samples and follows the expression ͑T͒ ϳ exp͑2 ͱ B / k B T͒, 4,5,7 where the parameter B shows strong dependence with Co content ͑see below͒. B is directly related to the Coulomb charging energy of the particles E C 0 , as B = E C 0 d , being d the interparticle distance and as the tunneling barrier height in momentum units.…”
Section: Transport Propertiesmentioning
confidence: 99%
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